scispace - formally typeset
H

Hiroaki Yanagida

Researcher at University of Tokyo

Publications -  282
Citations -  4465

Hiroaki Yanagida is an academic researcher from University of Tokyo. The author has contributed to research in topics: Electrical resistivity and conductivity & Ceramic. The author has an hindex of 34, co-authored 282 publications receiving 4324 citations. Previous affiliations of Hiroaki Yanagida include Lion Corporation & Lucideon.

Papers
More filters
Journal ArticleDOI

Dependence of Electrical Conductivity of ZnO on Degree of Sintering

TL;DR: In this article, the electrical resistivity of ZnO doped with Al2O3 was measured in air and under reduced pressure (∼0.5 mm Hg) in the range from 30° to 680°C as a function of the degree of sintering.
Journal ArticleDOI

Gas Sensing Characteristics of Porous ZnO and Pt/ZnO Ceramics

TL;DR: In this article, changes in resistivity and chemical changes in reducing gases were measured for porous zinc oxide ceramics with and without a platinum catalyst at 300° and 400°C to examine the gas sensing mechanism and the effect of platinum additions.
Journal ArticleDOI

Electrical anisotropy and a plausible explanation for dielectric anomaly of Bi4Ti3O12 single crystal

TL;DR: The electrical anisotropy of layer-structured bismuth titanate (Bi 4 Ti 3 O 12 ) has been investigated by measurements of Seebeck coefficient, dielectric permittivity, DC conductivity, and complex impedance on single and polycrystalline samples as mentioned in this paper.
Journal ArticleDOI

Low‐temperature conductivity of ZnO films prepared by chemical vapor deposition

TL;DR: In this paper, anaxis-oriented ZnO films were prepared in O2 atmosphere by chemical vapor deposition using zinc acetylacetonate for source material, and a minimum value of resistivity, 2.44 Ω cm, was obtained at a film formation temperature of 550 °C.
Journal ArticleDOI

High‐Resolution Electron Microscopy Observations of Stacking Faults in β‐SiC

TL;DR: In this article, structural images of stacking faults in β-SiC powder particles were obtained with a high-resolution electron microscope and the stacking faults were eliminated as grain growth proceeded at elevated temperatures.