H
Hoomi Choi
Researcher at Sungkyunkwan University
Publications - 8
Citations - 55
Hoomi Choi is an academic researcher from Sungkyunkwan University. The author has contributed to research in topics: Silicon & Deposition (phase transition). The author has an hindex of 4, co-authored 8 publications receiving 51 citations.
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Journal ArticleDOI
Development of CO2 gas cluster cleaning method and its characterization
Hoomi Choi,Hojoong Kim,Deok-Joo Yoon,Jong W. Lee,Bong-Kyun Kang,Min-Su Kim,Jin-Goo Park,Soon-Bark Kwon,Taesung Kim +8 more
TL;DR: In this paper, a new dry cleaning process using a CO"2 gas cluster beam is developed and a characterization method for gas cluster generation was studied experimentally, and the results showed that the contaminants were successfully removed without damage to the wafer surface.
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Blistering/exfoliation kinetics of GaAs by hydrogen and helium implantations
TL;DR: In this article, the influence of ion fluence, implantation and subsequent annealing temperatures on the blistering and exfoliation was studied by Rutherford Backscattering Spectroscopy (RBS), optical microscopy, high resolution X-ray diffraction (XRD) and cross-sectional transmission electron microscopy (XTEM).
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Plasma resistant aluminum oxide coatings for semiconductor processing apparatus by atmospheric aerosol spray method
TL;DR: In this article, a plasminar dense Al2O3 film was formed on a silicon substrate through the atmospheric aerosol spray method (AAS), which is a novel powder spray method, which can form a film under atmospheric pressure and low temperature conditions.
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In-SituMeasurements of Charged Nanoparticles Generated During Hot Wire Chemical Vapor Deposition of Silicon Using Particle Beam Mass Spectrometer
Ju-Seop Hong,Chan-Soo Kim,Seung-Wan Yoo,Seong-Han Park,Nong-Moon Hwang,Hoomi Choi,Dong-Bin Kim,Taesung Kim +7 more
TL;DR: In this article, the size distribution of positively and negatively charged Si gas phase nuclei generated during hot wire CVD under 1.5 torr was firstly measured, and the particle diameter at the peak of the size distributions was about 10 ∼ 13 nm.
Journal ArticleDOI
Real time measurements of charged gas phase nuclei during the deposition of silicon thin films by hot wire chemical vapor deposition
Ju-Seop Hong,Chan-Soo Kim,Seung-Wan Yoo,Seong-Han Park,Sung-Soo Lee,Nong-Moon Hwang,Hoomi Choi,Dong-Bin Kim,Taesung Kim +8 more
TL;DR: In this article, a particle beam mass spectrometer (PBMS) was used to measure a size distribution of nanoparticles under the deposition condition of silicon thin films, which showed that both positively and negatively charged silicon nanoparticles were abundantly generated in the gas phase.