scispace - formally typeset
H

Hoomi Choi

Researcher at Sungkyunkwan University

Publications -  8
Citations -  55

Hoomi Choi is an academic researcher from Sungkyunkwan University. The author has contributed to research in topics: Silicon & Deposition (phase transition). The author has an hindex of 4, co-authored 8 publications receiving 51 citations.

Papers
More filters
Journal ArticleDOI

Development of CO2 gas cluster cleaning method and its characterization

TL;DR: In this paper, a new dry cleaning process using a CO"2 gas cluster beam is developed and a characterization method for gas cluster generation was studied experimentally, and the results showed that the contaminants were successfully removed without damage to the wafer surface.
Journal ArticleDOI

Blistering/exfoliation kinetics of GaAs by hydrogen and helium implantations

TL;DR: In this article, the influence of ion fluence, implantation and subsequent annealing temperatures on the blistering and exfoliation was studied by Rutherford Backscattering Spectroscopy (RBS), optical microscopy, high resolution X-ray diffraction (XRD) and cross-sectional transmission electron microscopy (XTEM).
Journal ArticleDOI

Plasma resistant aluminum oxide coatings for semiconductor processing apparatus by atmospheric aerosol spray method

TL;DR: In this article, a plasminar dense Al2O3 film was formed on a silicon substrate through the atmospheric aerosol spray method (AAS), which is a novel powder spray method, which can form a film under atmospheric pressure and low temperature conditions.
Journal ArticleDOI

In-SituMeasurements of Charged Nanoparticles Generated During Hot Wire Chemical Vapor Deposition of Silicon Using Particle Beam Mass Spectrometer

TL;DR: In this article, the size distribution of positively and negatively charged Si gas phase nuclei generated during hot wire CVD under 1.5 torr was firstly measured, and the particle diameter at the peak of the size distributions was about 10 ∼ 13 nm.
Journal ArticleDOI

Real time measurements of charged gas phase nuclei during the deposition of silicon thin films by hot wire chemical vapor deposition

TL;DR: In this article, a particle beam mass spectrometer (PBMS) was used to measure a size distribution of nanoparticles under the deposition condition of silicon thin films, which showed that both positively and negatively charged silicon nanoparticles were abundantly generated in the gas phase.