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Igor L. Markov
Researcher at University of Michigan
Publications - 331
Citations - 15880
Igor L. Markov is an academic researcher from University of Michigan. The author has contributed to research in topics: Quantum computer & Quantum algorithm. The author has an hindex of 65, co-authored 327 publications receiving 14400 citations. Previous affiliations of Igor L. Markov include Synopsys & Google.
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As Accurate as Needed, as Efficient as Possible: Approximations in DD-based Quantum Circuit Simulation
TL;DR: This paper proposes two new DD-based simulation strategies that approximate the quantum states to attain more compact representations, while, at the same time, allowing the user to control the resulting degradation in accuracy.
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“Scaling” the impact of EDA education Preliminary findings from the CCC workshop series on extreme scale design automation
Iris Bahar,Alex K. Jones,Srinivas Katkoori,Patrick H. Madden,Diana Marculescu,Igor L. Markov +5 more
TL;DR: Some preliminary findings from the first of a series of Computing Community Consortium sponsored workshops emphasizing challenges in finding and preparing the next generation of electronic design professionals are shared.
Proceedings ArticleDOI
Uniformly-Switching Logic for Cryptographic Hardware
Igor L. Markov,Dmitri Maslov +1 more
TL;DR: This work seeks to equalize switching activity of a circuit over all possible inputs and input transitions by adding redundant gates and increasing the overall number of signal transitions, and presents a doubling construction that equalizes power dissipation without requiring drastic changes in CAD tools.
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Partitioning with terminals: a “new” problem and new benchmarks
TL;DR: This paper empirically shows that with fixed terminals in the instance, less effort is needed to stably reach a given solution quality, and develops new benchmark formats that flexibly capture the presence of terminals and any geometric embedding information associated with the partitioning instance.
Proceedings ArticleDOI
Improving testability and soft-error resilience through retiming
TL;DR: This work explores the fundamental relations between the SER of sequential circuits and their testability in scan mode, and appears to be the first to improve both through retiming.