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Ik Su Chun
Researcher at University of Illinois at Urbana–Champaign
Publications - 21
Citations - 1482
Ik Su Chun is an academic researcher from University of Illinois at Urbana–Champaign. The author has contributed to research in topics: Silicon & Etching (microfabrication). The author has an hindex of 12, co-authored 21 publications receiving 1359 citations.
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Journal ArticleDOI
GaAs photovoltaics and optoelectronics using releasable multilayer epitaxial assemblies
Jongseung Yoon,Sung Jin Jo,Sung Jin Jo,Ik Su Chun,Inhwa Jung,Hoon Kim,Matthew Meitl,Etienne Menard,Xiuling Li,James J. Coleman,Ungyu Paik,John A. Rogers +11 more
TL;DR: This work describes materials and fabrication concepts that address many of these challenges of compound semiconductors such as GaAs in applications whose cost structures, formats, area coverages or modes of use are incompatible with conventional growth or integration strategies.
Journal ArticleDOI
Nonlithographic patterning and metal-assisted chemical etching for manufacturing of tunable light-emitting silicon nanowire arrays
Winston Chern,Keng Hsu,Ik Su Chun,Bruno Azeredo,Numair Ahmed,Kyou Hyun Kim,Jian-Min Zuo,Nicholas X. Fang,Placid M. Ferreira,Xiuling Li +9 more
TL;DR: A top-down fabrication method that involves the combination of superionic-solid-state-stamping (S4) patterning with metal-assisted-chemical-etching (MacEtch) to produce silicon nanowire arrays with defined geometry and optical properties in a manufacturable fashion is reported.
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Planar GaAs Nanowires on GaAs (100) Substrates: Self-Aligned, Nearly Twin-Defect Free, and Transfer-Printable
TL;DR: Using the concept of sacrificial layers and elevation of Au catalyst modulated by growth condition, this work demonstrates for the first time a large area direct transfer process for nanowires formed by a bottom-up approach that can maintain both the position and alignment.
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Geometry effect on the strain-induced self-rolling of semiconductor membranes.
TL;DR: Results reported here provide critical information for precise positioning and uniform large area assembly of semiconducting micro- and nanotubes for applications in photonics, microelectromechanical systems, etc.
Journal ArticleDOI
Topography and refractometry of nanostructures using spatial light interference microscopy
Zhuo Wang,Ik Su Chun,Xiuling Li,Zhun-Yong Ong,Eric Pop,Larry J. Millet,Martha U. Gillette,Gabriel Popescu +7 more
TL;DR: This study exploits SLIM's ability to perform topography at a single atomic layer in graphene and extracts the axially averaged refractive index of semiconductor nanotubes and a neurite of a live hippocampal neuron in culture to set the basis for novel high-throughput topography and refractometry of man-made and biological nanostructures.