scispace - formally typeset
J

J. Derek Demaree

Researcher at United States Army Research Laboratory

Publications -  18
Citations -  519

J. Derek Demaree is an academic researcher from United States Army Research Laboratory. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 10, co-authored 18 publications receiving 481 citations.

Papers
More filters
Journal ArticleDOI

Surface modification of polyamide fibers and films using atmospheric plasmas

TL;DR: In this article, polyamide (Nylon 6) fibers and films were treated under atmospheric pressure glow discharges (APGD) and the effects on the morphology and chemistry of the material were studied.
Journal ArticleDOI

Neodymium ion dopant effects on the phase transformation in sol-gel derived titania nanostructures

TL;DR: In this paper, the effects of neodymium ion doping on the titania lattice were studied, showing that the anatase to rutile phase transformation in TiO 2 showed a maximum increase in activation energy for 0.1 ǫ nd 3+ doped with no further response at higher dopant concentrations.
Journal ArticleDOI

Nucleation of HfO2 atomic layer deposition films on chemical oxide and H-terminated Si

TL;DR: In this article, a comparison of the nucleation stage of the films on OH- and H-terminated Si(100) surfaces has been performed using Rutherford backscattering spectrometry, x-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE).
Journal ArticleDOI

Interface of atomic layer deposited HfO2 films on GaAs (100) surfaces

TL;DR: In this article, tetrakis(dimethylamino)hafnium/H2O atomic layer deposition (ALD) was used to remove the Ga and As native oxides.
Journal ArticleDOI

Growth and interface of HfO2 films on H-terminated Si from a TDMAH and H2O atomic layer deposition process

TL;DR: In this paper, the initial stage of HO2 thin film growth on OH- and H-terminated Si(100) surfaces was investigated using Rutherford backscattering spectrometry (RBS), x-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE).