J
J. Derek Demaree
Researcher at United States Army Research Laboratory
Publications - 18
Citations - 519
J. Derek Demaree is an academic researcher from United States Army Research Laboratory. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 10, co-authored 18 publications receiving 481 citations.
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Journal ArticleDOI
Surface modification of polyamide fibers and films using atmospheric plasmas
Daphne Pappas,Andres A. Bujanda,J. Derek Demaree,J. K. Hirvonen,Wendy E. Kosik,Robert E. Jensen,Steven H. McKnight +6 more
TL;DR: In this article, polyamide (Nylon 6) fibers and films were treated under atmospheric pressure glow discharges (APGD) and the effects on the morphology and chemistry of the material were studied.
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Neodymium ion dopant effects on the phase transformation in sol-gel derived titania nanostructures
TL;DR: In this paper, the effects of neodymium ion doping on the titania lattice were studied, showing that the anatase to rutile phase transformation in TiO 2 showed a maximum increase in activation energy for 0.1 ǫ nd 3+ doped with no further response at higher dopant concentrations.
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Nucleation of HfO2 atomic layer deposition films on chemical oxide and H-terminated Si
TL;DR: In this article, a comparison of the nucleation stage of the films on OH- and H-terminated Si(100) surfaces has been performed using Rutherford backscattering spectrometry, x-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE).
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Interface of atomic layer deposited HfO2 films on GaAs (100) surfaces
TL;DR: In this article, tetrakis(dimethylamino)hafnium/H2O atomic layer deposition (ALD) was used to remove the Ga and As native oxides.
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Growth and interface of HfO2 films on H-terminated Si from a TDMAH and H2O atomic layer deposition process
TL;DR: In this paper, the initial stage of HO2 thin film growth on OH- and H-terminated Si(100) surfaces was investigated using Rutherford backscattering spectrometry (RBS), x-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE).