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J. J. Vegh

Researcher at University of California, Berkeley

Publications -  2
Citations -  143

J. J. Vegh is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: Surface roughness & X-ray photoelectron spectroscopy. The author has an hindex of 2, co-authored 2 publications receiving 134 citations.

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Relationship between nanoscale roughness and ion-damaged layer in argon plasma exposed polystyrene films

TL;DR: In this article, the authors investigated the question of a possible relationship between the formation of nanoscale roughening and the simultaneous introduction of a nanometer-thick, densified surface layer that is formed on polymers due to plasma damage.
Journal ArticleDOI

Near-surface modification of polystyrene by Ar+: Molecular dynamics simulations and experimental validation

TL;DR: In this paper, molecular dynamics simulations of 100eV Ar+ bombardment of a model polystyrene (PS) surface are presented, showing that the system transitions from an initially high sputter yield (SY) for the virgin polymer to a drastically lower SY as steady state is approached.