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James H. Kaufman

Researcher at IBM

Publications -  150
Citations -  5513

James H. Kaufman is an academic researcher from IBM. The author has contributed to research in topics: Population & Metagenomics. The author has an hindex of 31, co-authored 150 publications receiving 5298 citations. Previous affiliations of James H. Kaufman include University of Pennsylvania & University of California, Santa Barbara.

Papers
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Symmetry breaking in nitrogen-doped amorphous carbon: Infrared observation of the Raman-active G and D bands.

TL;DR: In this article, the preparation of hard nitrogenated amorphous carbon films doped with as much as 20 at. % nitrogen was reported, and the nitrogen groups created by doping do not dramatically affect the film structure, but are found to break symmetry in the Raman-active G (graphitic) and D (disordered) bands to become ir active.
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Charge storage in doped poly(thiophene): Optical and electrochemical studies

TL;DR: In this paper, the authors present a new method of electrochemical polymerization of poly(thiophene) using dithiophene as the starting material, from which they obtain a high-quality film with a sharp interband absorption edge.
Patent

Magnetic memory array using magnetic tunnel junction devices in the memory cells

TL;DR: In this article, a nonvolatile magnetic random access memory (MRAM) is proposed, where each memory cell is a magnetic tunnel junction (MTJ) element and a diode electrically connected in series.
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Degradation and failure of MEH‐PPV light‐emitting diodes

TL;DR: In this article, two primary modes of degradation are identified: oxidation of the polymer leads to the formation of aromatic aldehyde, which quenches the fluorescence, and concomitant chain scission results in reduced carrier mobility.
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Physical description of a viscoelastically loaded AT‐cut quartz resonator

TL;DR: In this article, the authors describe the electrical admittance of a plane-parallel resonator loaded on one face with a viscoelastic medium, including the piezoelectric effect of the quartz transducer and the shear modulus and viscosity of the overlayer.