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Jinlin Wang

Researcher at Intel

Publications -  29
Citations -  1250

Jinlin Wang is an academic researcher from Intel. The author has contributed to research in topics: Thermal conductivity & Viscosity. The author has an hindex of 10, co-authored 28 publications receiving 1120 citations.

Papers
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Journal ArticleDOI

Measurements of nanofluid viscosity and its implications for thermal applications

TL;DR: Experimental results on the viscosity of alumina-based nanofluids are reported for various shear rates, temperature, nanoparticle diameter, and nanoparticle volume fraction.
Journal ArticleDOI

Thermal Resistance of Particle Laden Polymeric Thermal Interface Materials

TL;DR: In this article, a rheology-based semi-empirical model for the prediction of the bond line thickness (BLT) of particle laden polymers is presented.
Patent

Electronic packages having good reliability comprising low modulus thermal interface materials

TL;DR: In this paper, an electronic package includes a heat-generating electronic component such as an integrated circuit chip, a thermally conductive member, which may be an integrated heat spreader, and a low modulus thermal interface material in heat conducting relation between the electronic component and the thermally conducting member.
Journal ArticleDOI

Underfill of flip chip on organic substrate: viscosity, surface tension, and contact angle

TL;DR: Experimental methods were developed to measure the surface tension and the contact angle of underfills at temperatures over 100 °C and showed that the contact angles for underfill on a substrate was time dependent, and the interaction between underfill and substrate affects not only gap filling, but also filleting.
Journal ArticleDOI

The effects of rheological and wetting properties on underfill filler settling and flow voids in flip chip packages.

TL;DR: How the rheological properties can affect underfill filler settling and flow voids is discussed and it was shown that the underfills with small fillers have shear-thickening viscosity and yield stress.