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Joanna Schmit

Researcher at Veeco

Publications -  75
Citations -  2104

Joanna Schmit is an academic researcher from Veeco. The author has contributed to research in topics: Interferometry & White light interferometry. The author has an hindex of 22, co-authored 75 publications receiving 2029 citations. Previous affiliations of Joanna Schmit include University of Arizona.

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Performance advances in interferometric optical profilers for imaging and testing

TL;DR: Interferometric optical profilers deliver non-contact, fast, full-field measurements with vertical resolution down to a fraction of a nanometer as discussed by the authors, allowing for the analysis of not only static but also dynamic objects, like cantilevers and other microelectromechanical system devices, moving or vibrating at up to 1 MHz frequencies.
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High-stability white-light interferometry with reference signal for real-time correction of scanning errors

TL;DR: A white-light interferometer capable of accounting for scanning errors and correcting them in real time through the monitoring of the scanner motion is described, and significant improvements both in the accuracy and repeatability are demonstrated experimentally.
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Temporal correlation vortices and topological dispersion.

TL;DR: Interference measurements of a polychromatic partially coherent light source verify the existence of a temporal correlation vortex and topological dispersion is found to destabilize this singularity.
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High throughput cell nanomechanics with mechanical imaging interferometry.

TL;DR: The results indicate that mechanical imaging interferometry is a sensitive and scalable technology for measuring the nanomechanical properties of large arrays of live cells in fluid.
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Spectrally resolved phase-shifting interferometry of transparent thin films: sensitivity of thickness measurements.

TL;DR: The sensitivity of this technique depends on the thickness of the thin-film layer as well as its refractive index, and the results are valid for any other method based on measurements of the spectral phase such as wavelength scanning or white-light interferometry.