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John Silcox

Researcher at Cornell University

Publications -  166
Citations -  8438

John Silcox is an academic researcher from Cornell University. The author has contributed to research in topics: Scanning transmission electron microscopy & Electron energy loss spectroscopy. The author has an hindex of 44, co-authored 166 publications receiving 8060 citations. Previous affiliations of John Silcox include Corning Inc. & Alcatel-Lucent.

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Atomic and Electronic Structure of Graphene-Oxide

TL;DR: The results of this detailed analysis reveal that the GO is rough with an average surface roughness of 0.6 nm and the structure is predominantly amorphous due to distortions from sp3 C-O bonds.
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Non-blinking semiconductor nanocrystals

TL;DR: As photoluminescence blinking severely limits the usefulness of nanocry crystals in applications requiring a continuous output of single photons, these non-blinking nanocrystals may enable substantial advances in fields ranging from single-molecule biological labelling to low-threshold lasers.
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

TL;DR: Using a fifth-order aberration-corrected scanning transmission electron microscope, which provides a factor of 100 increase in signal over an uncorrected instrument, two-dimensional elemental and valence-sensitive imaging at atomic resolution is demonstrated by means of electron energy-loss spectroscopy.
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Generation of Megawatt Optical Solitons in Hollow-Core Photonic Band-Gap Fibers

TL;DR: The results demonstrate a unique capability to deliver high-power pulses in a single spatial mode over distances exceeding 200 meters, and represent an increase in the power that can be propagated in an optical fiber of two orders of magnitude.
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Simulation of annular dark field stem images using a modified multislice method

TL;DR: The multislice method of image simulation has been extensively applied to conventional transmission electron micrographs (CTEM), but not yet to scanning transmission electron microscopic (STEM) is adapted for application to the STEM and several examples relevant to the VG-HB501 STEM are presented as mentioned in this paper.