scispace - formally typeset
J

Jonathan L. Kirschman

Researcher at Georgia Institute of Technology

Publications -  15
Citations -  912

Jonathan L. Kirschman is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Interferometry & Tiltmeter. The author has an hindex of 12, co-authored 15 publications receiving 664 citations. Previous affiliations of Jonathan L. Kirschman include Lawrence Berkeley National Laboratory.

Papers
More filters
Journal ArticleDOI

Unifying in vitro and in vivo IVT mRNA expression discrepancies in skeletal muscle via mechanotransduction

TL;DR: In vitro hydrogel model more accurately recapitulated the results obtained in vivo upon IM injection, indicating that this approach may assist in the characterization of mRNA based vaccines.
Journal ArticleDOI

In Vitro Transcribed mRNA Vaccines with Programmable Stimulation of Innate Immunity.

TL;DR: A strategy for increasing translation of a model IVT mRNA vaccine while simultaneously modulating its immune-stimulatory properties in a programmable fashion, without relying on delivery vehicle formulations is presented.
Proceedings ArticleDOI

Precision Tiltmeter as a Reference for Slope Measuring Instruments

TL;DR: In this article, the use of a precision tiltmeter as a reference channel for low-spatial-frequency slope measurement with x-ray optics was investigated and the results showed that at an appropriate arrangement, the tiltmeter provided a slope reference for the Long Trace Profiler (LTP) system with accuracy on the level of 0.1 μrad (rms).
Journal ArticleDOI

Exploitation of Synthetic mRNA To Drive Immune Effector Cell Recruitment and Functional Reprogramming In Vivo

TL;DR: This study demonstrates how IVT strategies can be combined to recruit and reprogram immune effector cells that have the capacity to fulfill complex biological tasks in vivo.
Journal Article

Precision Tiltmeter as a Reference for Slope Measuring Instruments

TL;DR: In this article, the use of a precision tiltmeter as a reference channel was investigated for low-spatial-frequency slope measurement with x-ray optics, and it was shown that at an appropriate experimental arrangement, the tiltmeter provided a slope reference for the LTP system with accuracy on the level of 0.1 micro-rad (rms).