J
Jonathan Lind
Researcher at Lawrence Livermore National Laboratory
Publications - 61
Citations - 1955
Jonathan Lind is an academic researcher from Lawrence Livermore National Laboratory. The author has contributed to research in topics: Grain boundary & Diffraction. The author has an hindex of 21, co-authored 58 publications receiving 1526 citations. Previous affiliations of Jonathan Lind include Carnegie Mellon University & RJ Lee Group.
Papers
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Journal ArticleDOI
High-energy diffraction microscopy at the advanced photon source
Ulrich Lienert,S. F. Li,C. M. Hefferan,Jonathan Lind,Robert M. Suter,Joel V. Bernier,Nathan R. Barton,M. C. Brandes,Michael J. Mills,Matthew P. Miller,Bo Jakobsen,Wolfgang Pantleon +11 more
TL;DR: The status of the HEDM program at the 1-ID beam line of the Advanced Photon Source is reported in this article, where the authors demonstrate the mapping of grain boundary topology, the evaluation of stress tensors of individual grains during tensile deformation and comparison to a finite element modeling simulation, and the characterization of evolving dislocation structure.
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Polycrystal Plasticity: Comparison Between Grain- Scale Observations of Deformation and Simulations
Reeju Pokharel,Jonathan Lind,Anand K. Kanjarla,Ricardo A. Lebensohn,S. F. Li,Peter Kenesei,Robert M. Suter,Anthony D. Rollett +7 more
TL;DR: In this article, the response of polycrystals to plastic deformation is studied at the level of variations within individual grains, and comparisons are made to theoretical calculations using crystal plasticity (CP).
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Direct measurement of critical resolved shear stress of prismatic and basal slip in polycrystalline Ti using high energy X-ray diffraction microscopy
Leyun Wang,Leyun Wang,Z. Zheng,H. J. Phukan,Peter Kenesei,Jun-Sang Park,Jonathan Lind,Jonathan Lind,Robert M. Suter,Thomas R. Bieler +9 more
TL;DR: In this paper, the critical resolved shear stress (CRSS) values of different slip modes are directly measured with an in-situ high energy X-ray diffraction microscopy (HEDM) experiment.
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New opportunities for quantitative tracking of polycrystal responses in three dimensions
Jay C. Schuren,Paul A. Shade,Joel V. Bernier,S. F. Li,Basil Blank,Jonathan Lind,Jonathan Lind,Peter Kenesei,Ulrich Lienert,Robert M. Suter,T. J. Turner,Dennis M. Dimiduk,Jonathan Almer +12 more
TL;DR: In this article, the authors demonstrate an integrated experimental capability utilizing high energy X-rays that provides an in situ, micrometer-scale probe for tracking evolving microstructure and intergranular stresses during quasi-static mechanical testing.
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A rotational and axial motion system load frame insert for in situ high energy x-ray studies
Paul A. Shade,Basil Blank,Jay C. Schuren,T. J. Turner,Peter Kenesei,Kurt Goetze,Robert M. Suter,Joel V. Bernier,S. F. Li,Jonathan Lind,Ulrich Lienert,Jonathan Almer +11 more
TL;DR: The design and performance of a load frame insert with a rotational and axial motion system that has been developed to meet the requirements of experimental design requirements and an example dataset from a deforming titanium alloy demonstrates the new capability.