K
Kathy Lu
Researcher at Virginia Tech
Publications - 618
Citations - 45316
Kathy Lu is an academic researcher from Virginia Tech. The author has contributed to research in topics: Nanocrystalline material & Grain boundary. The author has an hindex of 86, co-authored 602 publications receiving 38258 citations. Previous affiliations of Kathy Lu include Kyoto University & Max Planck Society.
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Ultrahigh strength and high electrical conductivity in copper
TL;DR: Pure copper samples with a high density of nanoscale growth twins are synthesized and show a tensile strength about 10 times higher than that of conventional coarse-grained copper, while retaining an electrical conductivity comparable to that of pure copper.
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Strengthening Materials by Engineering Coherent Internal Boundaries at the Nanoscale
TL;DR: An approach to optimize strength and ductility is outlined by identifying three essential structural characteristics for boundaries: coherency with surrounding matrix, thermal and mechanical stability, and smallest feature size finer than 100 nanometers.
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Revealing the Maximum Strength in Nanotwinned Copper
TL;DR: The maximum strength of nanotwinned copper samples with different twin thicknesses is investigated, finding that the strength increases with decreasing twin thickness, reaching a maximum at 15 nanometers, followed by a softening at smaller values that is accompanied by enhanced strain hardening and tensile ductility.
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Revealing Extraordinary Intrinsic Tensile Plasticity in Gradient Nano-Grained Copper
TL;DR: The extraordinary intrinsic plasticity of gradient NG structures offers their potential for use as advanced coatings of bulk materials in both high strength and ductility materials.
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Dislocation nucleation governed softening and maximum strength in nano-twinned metals
TL;DR: It is shown that dislocation nucleation governs the strength of nano-twinned materials, resulting in their softening below a critical twin thickness, and the critical twin-boundary spacing and the maximum strength depend on the grain size.