A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

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Principles Of Optics Electromagnetic Theory Of Propagation Interference And Diffraction Of Light

Diamond has unique properties which make it the ideal material for use in synchrotron instrumentation. X-ray optics made of diamond are almost transparent, they possess strength, and are subject to very low thermal expansion; therefore they will be able to withstand the powerful beams generated by fourth-generation light sources without compromising brilliance. For this reason, several groups are attempting fabrication of refractive lenses and zone plates made of diamond. Lithography and, in general, microfabrication technology, are the ultimate tools for the innovation of synchrotron focusing optics. We propose to combine modern silicon microtechnology with advanced deposition methods to fabricate nanocrystalline-diamond lenses for third- and fourth-generation synchrotron sources. The fabrication method is described here and microfocusing synchrotron tests are illustrated.

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A planar refractive x-ray lens made of nanocrystalline diamond

Self-assembly is possibly the most effective and versatile strategy for surface functionalization. Self-assembled monolayers (SAMs) can be formed on (semi-)conductor and dielectric surfaces, and have been used in a variety of technological applications. This work aims to review the strategy behind the design and use of self-assembled monolayers in organic electronics, discuss the mechanism of interaction of SAMs in a microscopic device, and highlight the applications emerging from the integration of SAMs in an organic device. The possibility of performing surface chemistry tailoring with SAMs constitutes a versatile approach towards the tuning of the electronic and morphological properties of the interfaces relevant to the response of an organic electronic device. Functionalisation with SAMs is important not only for imparting stability to the device or enhancing its performance, as sought at the early stages of development of this field. SAM-functionalised organic devices give rise to completely new types of behavior that open unprecedented applications, such as ultra-sensitive label-free biosensors and SAM/organic transistors that can be used as robust experimental gauges for studying charge tunneling across SAMs.

Self-assembled monolayers in organic electronics

Rechargeable battery technologies have ignited major breakthroughs in contemporary society, including but not limited to revolutions in transportation, electronics, and grid energy storage The remarkable development of rechargeable batteries is largely attributed to in-depth efforts to improve battery electrode and electrolyte materials There are, however, still intimidating challenges of lower cost, longer cycle and calendar life, higher energy density, and better safety for large scale energy storage and vehicular applications Further progress with rechargeable batteries may require new chemistries (lithium ion batteries and beyond) and better understanding of materials electrochemistry in the various battery technologies In the past decade, advancement of battery materials has been complemented by new analytical techniques that are capable of probing battery chemistries at various length and time scales Synchrotron X-ray techniques stand out as one of the most effective methods that allow for near

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Synchrotron X-ray Analytical Techniques for Studying Materials Electrochemistry in Rechargeable Batteries

We present design and implementation details of the Diamond-NOM (nanometre optical metrology)—a non-contact profiler capable of measuring the surface topography of large (up to 1500 mm long) and heavy (up to 150 kg) optical assemblies with sub-nanometre resolution and repeatability. These levels of performance are essential to fabricate and optimize next generation optics. The capabilities of the Diamond-NOM have already enabled collaborations with optic manufacturers, including production of a preferentially deposited, large (1.2 m), synchrotron mirror with a slope error of ∼0.44 μrad rms and using bimorph technology to reduce figure error of a super-polished (elastic emission machining) optic to

The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability

We demonstrate an extension of the x-ray grating interferometer three modal imaging method to a generalized stepping scheme using a phase object with small, random features. The method allows the recovery of the absorption, scattering, and two-dimensional phase image of the sample from a raster scan of the phase object. An additional extension of the method to recover the effective wave-front curvature is also described. The technique provides fine sensitivity and high spatial resolution and has only low requirements on spatial and longitudinal coherence of the x-ray beam. Imaging modes and processing methods are explained, and an experimental demonstration of the technique is provided by imaging a feather and the quantitative characterization of a compound refractive lens.

X-ray multimodal imaging using a random-phase object

X-ray phase and dark-field imaging techniques provide complementary and inaccessible information compared to conventional X-ray absorption or visible light imaging. However, such methods typically require sophisticated experimental apparatus or X-ray beams with specific properties. Recently, an X-ray speckle-based technique has shown great potential for X-ray phase and dark-field imaging using a simple experimental arrangement. However, it still suffers from either poor resolution or the time consuming process of collecting a large number of images. To overcome these limitations, in this report we demonstrate that absorption, dark-field, phase contrast, and two orthogonal differential phase contrast images can simultaneously be generated by scanning a piece of abrasive paper in only one direction. We propose a novel theoretical approach to quantitatively extract the above five images by utilising the remarkable properties of speckles. Importantly, the technique has been extended from a synchrotron light source to utilise a lab-based microfocus X-ray source and flat panel detector. Removing the need to raster the optics in two directions significantly reduces the acquisition time and absorbed dose, which can be of vital importance for many biological samples. This new imaging method could potentially provide a breakthrough for numerous practical imaging applications in biomedical research and materials science.

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From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paper.

We present a method to measure the surface profile of hard X-ray reflective optics with nanometer height accuracy and sub-millimetre lateral resolution. The technique uses X-ray near-field speckle, generated by a scattering membrane translated using a piezo motor, to infer the deflection of X-rays from the surface. The method provides a nano-radian order accuracy on the mirror slopes in both the tangential and sagittal directions. As a demonstration, a pair of focusing mirrors mounted in a Kirkpatrick-Baez (KB) configuration were characterized and the results were in good agreement with offline metrology data. It is hoped that the new technique will provide feedback to optic manufacturers to improve mirror fabrication and be useful for the online optimization of active, nano-focusing mirrors on modern synchrotron beamlines.

Kawal Sawhney

Papers

A planar refractive x-ray lens made of nanocrystalline diamond

The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability

X-ray multimodal imaging using a random-phase object

From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paper.

At-wavelength metrology of hard X-ray mirror using near field speckle