K
Krishnan Balasubramaniam
Researcher at Indian Institute of Technology Madras
Publications - 493
Citations - 7351
Krishnan Balasubramaniam is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Ultrasonic sensor & Lamb waves. The author has an hindex of 40, co-authored 486 publications receiving 6266 citations. Previous affiliations of Krishnan Balasubramaniam include University of Colorado Boulder & Marshall Space Flight Center.
Papers
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Measuring Newtonian viscosity from the phase of reflected ultrasonic shear wave
TL;DR: An acoustic shear impedance model is employed to obtain a relation between the viscosity of a Newtonian fluid and phase characteristics of ultrasonic shear wave reflection from a solid-fluid interface, demonstrating that phase measurement provides improved measurements.
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Simulation of ultrasonic phased array technique for imaging and sizing of defects using longitudinal waves
TL;DR: In this article, the authors used the finite-difference time domain (FDTD) method to simulate the effect of various angles of incidence on the defect definition, i.e., with respect to imaging and sizing, using the relative arrival time technique.
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Helicity patterns on the sun
TL;DR: In this paper, the authors review the observations of large-scale patterns of helicity in solar atmosphere and their possible relationship with (sub-)photospheric processes, and show that these patterns of mixed helicity were observed at different spatial scales in each hemisphere.
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A hybrid finite element model for simulation of electromagnetic acoustic transducer (EMAT) based plate waves
TL;DR: In this article, the authors presented simulations of the generation of Lamb wave modes in thin plates using a meander coil (meander line) EMAT, which works under the principle of Lorentz force mechanism in non-magnetic materials.
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Shear-wave time of flight diffraction (S-TOFD) technique
TL;DR: In this paper, the authors used the shear wave-diffracted signal instead of the longitudinal wave for near-surface inspection of a crack tip and demonstrated an increase in the defect sizing accuracy.