K
Kun-Shan Chen
Researcher at Guilin University of Technology
Publications - 264
Citations - 6112
Kun-Shan Chen is an academic researcher from Guilin University of Technology. The author has contributed to research in topics: Scattering & Synthetic aperture radar. The author has an hindex of 34, co-authored 246 publications receiving 5231 citations. Previous affiliations of Kun-Shan Chen include University of Texas at Arlington & Wuhan University.
Papers
More filters
Journal ArticleDOI
Backscattering from a randomly rough dielectric surface
TL;DR: A backscattering model for scattering from a randomly rough dielectric surface is developed and both like- and cross-polarized scattering coefficients are obtained that satisfy reciprocity and contain only multiple scattering terms.
Journal ArticleDOI
Improved Sigma Filter for Speckle Filtering of SAR Imagery
TL;DR: The bias problem is solved by redefining the sigma range based on the speckle probability density functions, and a target signature preservation technique is developed to mitigate the problems of blurring and depressing strong reflective scatterers.
Journal ArticleDOI
Microwave vegetation indices for short vegetation covers from satellite passive microwave sensor AMSR-E
Jiancheng Shi,Jiancheng Shi,Thomas J. Jackson,Jing Tao,Jinyang Du,Rajat Bindlish,L. Lu,L. Lu,Kun-Shan Chen +8 more
TL;DR: In this article, the authors established the theoretical basis for microwave vegetation indices (MVIs) based on data from the Advanced Microwave Scanning Radiometer (AMSR-E) on the Aqua satellite.
Journal ArticleDOI
A parameterized multifrequency-polarization surface emission model
TL;DR: A parameterized bare surface emission model-the Qp model, which relates the effects of the surface roughness on the emission signals through the roughness variable Qp at the polarization p, is developed.
Journal ArticleDOI
A reappraisal of the validity of the IEM model for backscattering from rough surfaces
Tzong-Dar Wu,Kun-Shan Chen +1 more
TL;DR: The results of comparisons with both the numerical simulations and measurements for the backscattering case indicate that the IEM is improved, becoming more accurate and practical to use.