L
Laung-Terng Wang
Researcher at Kyushu Institute of Technology
Publications - 80
Citations - 2958
Laung-Terng Wang is an academic researcher from Kyushu Institute of Technology. The author has contributed to research in topics: Automatic test pattern generation & Fault coverage. The author has an hindex of 28, co-authored 80 publications receiving 2927 citations. Previous affiliations of Laung-Terng Wang include Stanford University.
Papers
More filters
Journal ArticleDOI
Efficient Test Set Modification for Capture Power Reduction
Xiaoqing Wen,Tatsuya Suzuki,Seiji Kajihara,Kohei Miyase,Yoshihiro Minamoto,Laung-Terng Wang,Kewal K. Saluja +6 more
Patent
Method and apparatus for broadcasting scan patterns in a random access based integrated circuit
TL;DR: In this paper, the authors proposed a method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit (SBE).
Journal ArticleDOI
Testing of Synchronizers in Asynchronous FIFO
TL;DR: The proposed test method can apply the input patterns at different time and generate capture clock signals with different frequency regardless of phase-locked loop (PLL) of the design and detect all possible faults of the two-D-flip-flop synchronizers in the asynchronous FIFO interface.
Book ChapterDOI
Digital Test Architectures
TL;DR: This chapter presents a number of fundamental and advanced logic BIST architectures that allow the digital circuit to perform self-test on-chip, on-board, or in-system, and explores promising random-access scan architectures devised to further reduce test power dissipation and test application time while retaining the benefits of scan and logic Bist.
Journal ArticleDOI
Turbo1500: Core-Based Design for Test and Diagnosis
Laung-Terng Wang,R. Apte,Shianling Wu,Boryau Sheu,Wen-Ben Jone,Jianghao Guo,Kuen-Jong Lee,Wei-Shin Wang,Xiaoqing Wen,Hao-Jan Chao,Jinsong Liu,Yanlong Niu,Yi-Chih Sung,Chi-Chun Wang,Fangfang Li +14 more
TL;DR: In this paper, a set of tools and associated flow for DFT insertion and test generation based on IEEE Std 1500 is described, along with a detailed description of the tools and their associated flow.