L
Laung-Terng Wang
Researcher at Kyushu Institute of Technology
Publications - 80
Citations - 2958
Laung-Terng Wang is an academic researcher from Kyushu Institute of Technology. The author has contributed to research in topics: Automatic test pattern generation & Fault coverage. The author has an hindex of 28, co-authored 80 publications receiving 2927 citations. Previous affiliations of Laung-Terng Wang include Stanford University.
Papers
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Patent
Method and system to optimize test cost and disable defects for scan and bist memories
Laung-Terng Wang,Shyh-Horng Lin,Hsin-Po Wang,Xiaoqing Wen,Chi-Chan Hsu,Anthony M. Vu,Yo Han Park +6 more
TL;DR: In this paper, a method and apparatus for testing or diagnosing memories in an integrated circuit using memory BIST (built-in self-test) or memory scan techniques is presented.
Journal ArticleDOI
Linear feedback shift register design using cyclic codes
TL;DR: A design technique is given for linear-feedback shift registers (LFSR) that generate test patterns for pseudoexhaustive testing of networks with restricted output dependency that indicate that LFSRs based on cyclic codes are easier to implement and have lower hardware overhead than LFSR that use other linear codes.
Proceedings ArticleDOI
A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation
Xiaoqing Wen,Kohei Miyase,Tatsuya Suzuki,Yuta Yamato,Seiji Kajihara,Laung-Terng Wang,Kewal K. Saluja +6 more
TL;DR: Experimental results show the superiority of the new X-filling method for capture power reduction, based on two novel concepts: X-score for X-Filling target selection and probabilistic weighted capture transition count for Y-fills value selection.
Proceedings ArticleDOI
CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing
Hiroshi Furukawa,Xiaoqing Wen,Kohei Miyase,Yuta Yamato,Seiji Kajihara,Patrick Girard,Laung-Terng Wang,Mohammad Tehranipoor +7 more
TL;DR: CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.
Journal ArticleDOI
VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG
TL;DR: This paper proposes a new approach to reduce test data volume and test cycle count in scan-based testing by assuming a 1-to-1 scan configuration, in which the number of internal scan chains equals thenumber of external scan I/O ports or test channels from ATE.