L
Libor Rufer
Researcher at University of Grenoble
Publications - 108
Citations - 793
Libor Rufer is an academic researcher from University of Grenoble. The author has contributed to research in topics: Microphone & Surface acoustic wave. The author has an hindex of 13, co-authored 106 publications receiving 682 citations. Previous affiliations of Libor Rufer include École centrale de Lyon & Centre national de la recherche scientifique.
Papers
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Journal ArticleDOI
An Integrated Floating-Electrode Electric Microgenerator
TL;DR: In this article, a single-wafer floating-electrode electric microgenerator, integrating a micromechanical resonator and a number of electronic devices, is described.
Journal ArticleDOI
Micro-structured PDMS piezoelectric enhancement through charging conditions
Achraf Kachroudi,Achraf Kachroudi,Achraf Kachroudi,Skandar Basrour,Skandar Basrour,Libor Rufer,Libor Rufer,Alain Sylvestre,Fathi Jomni +8 more
TL;DR: In this article, micro-structured cellular polydimethylsiloxane (PDMS) materials were prepared by a low-cost molding process allowing us to control geometry and sample size.
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Effect of bias conditions on pressure sensors based on AlGaN/GaN High Electron Mobility Transistor
E. D. Le Boulbar,Michael Edwards,S. Vittoz,Gabriel Vanko,Klas Brinkfeldt,Libor Rufer,Per Johander,Tibor Lalinský,Christopher R. Bowen,Duncan W. E. Allsopp +9 more
TL;DR: In this article, the bias and pressure sensitivity of AlGaN/GaN High Electron Mobility Transistors (HEMTs) sensing elements strategically placed on a pressure sensitive diaphragm clamped at its edges was investigated.
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On-Chip Pseudorandom MEMS Testing
TL;DR: The use of a pseudo-random sequence makes the practical on-chip implementation very efficient in terms of the extra hardware required for on- chip testing, and is capable of providing vastly superior dynamic range in comparison to the straightforward technique using an impulse excitation.
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Built-in-self-test techniques for MEMS
TL;DR: In this article, the authors present a complete approach to MEMS built-in-self-test (BIST) based on pseudorandom testing, which is similar to the case of analog and mixed-signal circuits.