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Luis Rodríguez-Fernández

Researcher at National Autonomous University of Mexico

Publications -  98
Citations -  1488

Luis Rodríguez-Fernández is an academic researcher from National Autonomous University of Mexico. The author has contributed to research in topics: Ion implantation & Surface plasmon resonance. The author has an hindex of 22, co-authored 97 publications receiving 1396 citations. Previous affiliations of Luis Rodríguez-Fernández include Benemérita Universidad Autónoma de Puebla.

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Controlled anisotropic deformation of Ag nanoparticles by Si ion irradiation

TL;DR: In this article, the shape and alignment of silver nanoparticles embedded in a glass matrix is controlled using silicon ion irradiation, and they are transformed into anisotropic particles whose larger axis is along the ion beam.
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Enhanced Fano Resonance in Asymmetrical Au:Ag Heterodimers

TL;DR: In this paper, the authors found that the sensitivity of the dimer FR signaltothevariation of the surface plasmon resonance (SPR) is 2 times larger than the region where nm < 1.5, which opens up the possibility of utilizing the FR band for more efficient optical sensing applications.
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Understanding the ion-induced elongation of silver nanoparticles embedded in silica

TL;DR: This work has studied the elongation of silver nanoparticles irradiated with 40 MeV Bromine ions by means of in situ optical measurements, transmission electron microscopy and molecular dynamics simulations, and the agreement is excellent in both cases.
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Linear optical response of metallic nanoshells in different dielectric media

TL;DR: In this paper, the surface plasmon resonance (SPR) of metal nanoshells has been studied for different geometries and physical environments, and the SPR peak position can be tuned from 510 nm (2.43 eV) to 660 nm (1.88 eV).
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AFM, XPS and RBS studies of the growth process of CdS thin films on ITO/glass substrates deposited using an ammonia-free chemical process

TL;DR: A detailed study of the growth stages of CdS thin films on ITO/glass substrates by chemical bath deposition was done through X-ray photoelectron spectroscopy (XPS), Rutherford backscattering spectrometry (RBS), and atomic force microscopy (AFM) techniques as mentioned in this paper.