M
M. S. Finney
Researcher at University of Surrey
Publications - 22
Citations - 716
M. S. Finney is an academic researcher from University of Surrey. The author has contributed to research in topics: Ion beam & Diffraction. The author has an hindex of 13, co-authored 22 publications receiving 698 citations. Previous affiliations of M. S. Finney include University of Leicester.
Papers
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Journal ArticleDOI
Optical absorption study of ion beam synthesized polycrystalline semiconducting FeSi2
TL;DR: In this paper, the existence of a minimum direct band gap was demonstrated and its variation with the temperature was studied by means of a three-parameter thermodynamic model and the Einstein model.
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Strain relaxation during the initial stages of growth in Ge/Si(001)
A. A. Williams,J. M. C. Thornton,John Emyr MacDonald,R. G. van Silfhout,J. F. van der Veen,M. S. Finney,A. D. Johnson,C. Norris +7 more
TL;DR: Grazing-incidence x-ray diffraction results demonstrate that the critical thickness for strain relaxation is 3–4 monolayers (ML), which coincides with that at which islanding is observed.
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Plasma anandamide concentration and pregnancy outcome in women with threatened miscarriage.
TL;DR: The recommendation to treat patients with impending immunosuppression who have not previously received antitrypanosomal therapy should be interpreted in the context of the overall BII recommendation for T cruzi–infected adults up to age 50 years without advanced heart disease.
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Modulation of the endocannabinoid system in viable and non-viable first trimester pregnancies by pregnancy-related hormones
TL;DR: The association of higher AEA levels with early pregnancy failure and with beta-hCG and PAPP-A, but not with progesterone concentrations suggest that plasma AEA Levels and pregnancy failure are linked via a mechanism that may involve trophoblastic beta- hCG, and P APP-A; but not, progestersone production.
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The influence of Sb as a surfactant on the strain relaxation of Ge/Si(001)
J. M. C. Thornton,A. A. Williams,John Emyr MacDonald,R. G. van Silfhout,J. F. van der Veen,M. S. Finney,C. Norris +6 more
TL;DR: In this paper, surface x-ray diffraction was used to investigate the initial strain relaxation of Ge on Si(001) when a "surfactant" layer of Sb [0.7 monolayers (ML)] is present.