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M. S. Hegde

Researcher at Indian Institute of Science

Publications -  3
Citations -  288

M. S. Hegde is an academic researcher from Indian Institute of Science. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Sulfide. The author has an hindex of 3, co-authored 3 publications receiving 282 citations.

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Electronic passivation of GaAs surfaces through the formation of arsenic—sulfur bonds

TL;DR: In this article, X-ray photoelectron spectroscopy reveals that the remarkable electronic quality of GaAs/sulfide interfaces can be attributed to the formation of AsxSy phases which grow on an oxide-free GaAs surface.
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Enhanced electronic properties of GaAs surfaces chemically passivated by selenium reactions

TL;DR: In this article, chemical modifications of GaAs surfaces are described, which produce robust selenium layers that significantly enhance the electronic properties of the surface and reveal significant AsSe bond formation at the surface.
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GaAs Clusters in the Quantum Size Regime: Growth on High Surface Area Silica by Molecular Beam Epitaxy.

TL;DR: Study of the microcrystallite surfaces by x-ray photoelectron spectroscopy shows that they are covered with a shell of native oxides of gallium and arsenic, whose presence could explain the low luminescence efficiency of the clusters.