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Manfred Jaschke

Researcher at Max Planck Society

Publications -  11
Citations -  2533

Manfred Jaschke is an academic researcher from Max Planck Society. The author has contributed to research in topics: Self-assembled monolayer & Monolayer. The author has an hindex of 10, co-authored 11 publications receiving 2416 citations. Previous affiliations of Manfred Jaschke include Massachusetts Institute of Technology & University of Leeds.

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Calculation of thermal noise in atomic force microscopy

TL;DR: In this paper, the authors calculated the thermal noise of a cantilever with a free end by considering all possible vibration modes of the cantilevers and showed that if the end is supported by a hard surface, no thermal fluctuations of the deflection are possible.
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Measuring surface forces in aqueous electrolyte solution with the atomic force microscope

TL;DR: In this paper, it has been realized that the atomic force microscope, which is normally used to image the topography of surfaces with high resolution, can also be used to measure surface forces.
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Deposition of Organic Material by the Tip of a Scanning Force Microscope

TL;DR: In this article, the authors show that organic material can also be deposited on surfaces by a scanning force microscope (SFM) tip and demonstrate that aggregates of octadecanethiol onto mica can be formed immediately after contact between tip and surface.
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Height calibration of optical lever atomic force microscopes by simple laser interferometry

TL;DR: In this article, a new and simple interferometric method for height calibration of AFM piezo scanners is presented, where no additional equipment is required since the fixed wavelength of the laser diode is used as a calibration standard.