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Meifang Zhu

Researcher at Chinese Academy of Sciences

Publications -  15
Citations -  135

Meifang Zhu is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Thin film & Chemical vapor deposition. The author has an hindex of 8, co-authored 15 publications receiving 129 citations.

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Realization of radial p-n junction silicon nanowire solar cell based on low-temperature and shallow phosphorus doping.

TL;DR: The quantum efficiency spectra show that radial transport based on the shallow phosphorus doping of SiNW array improves the carrier collection property and then enhances the blue wavelength region response.
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Insulator-to-metal transition in heavily Ti-doped silicon thin film

TL;DR: In this paper, the electrical properties of crystallized Ti-doped amorphous silicon thin film by pulse laser melting shows the metal-like behavior, which indicates the happening of an insulator-to-metal transition with the crystallization process.
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Aligned amorphous and microcrystalline Si nanorods by glancing angle deposition at low temperature

TL;DR: Aligned amorphous and crystallized silicon nanorods (SiNRs) were successfully fabricated at low temperatures using radio frequency magnetron sputtering and hot wire chemical vapor deposition with glancing angle incident flux to test for photovoltaic application.
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The compact microcrystalline Si thin film with structure uniformity in the growth direction by hydrogen dilution profile

TL;DR: The hydrogen dilution profiling (HDP) technique has been developed to improve the quality and the crystalline uniformity in the growth direction of mu c-Si:H thin films prepared by hot-wire chemical-vapor deposition as discussed by the authors.
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Nano-structure in micro-crystalline silicon thin films studied by small-angle X-ray scattering

TL;DR: In this article, the influence of plasma and two-step hydrogen dilution (S H ) on nano-structure of hydrogenated micro-crystalline silicon thin films was studied by using synchrotron radiation small-angle X-ray scattering (SAXS) combined with Fourier transform infrared spectroscopy (FTIR) and flotation density measurement.