A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

We examine the current performance and future demands of interconnects to and on silicon chips. We compare electrical and optical interconnects and project the requirements for optoelectronic and optical devices if optics is to solve the major problems of interconnects for future high-performance silicon chips. Optics has potential benefits in interconnect density, energy, and timing. The necessity of low interconnect energy imposes low limits especially on the energy of the optical output devices, with a ~ 10 fJ/bit device energy target emerging. Some optical modulators and radical laser approaches may meet this requirement. Low (e.g., a few femtofarads or less) photodetector capacitance is important. Very compact wavelength splitters are essential for connecting the information to fibers. Dense waveguides are necessary on-chip or on boards for guided wave optical approaches, especially if very high clock rates or dense wavelength-division multiplexing (WDM) is to be avoided. Free-space optics potentially can handle the necessary bandwidths even without fast clocks or WDM. With such technology, however, optics may enable the continued scaling of interconnect capacity required by future chips.

Device Requirements for Optical Interconnects to Silicon Chips

Single-molecule surface-enhanced Raman scattering (SM-SERS) is one of the vital applications of plasmonic nanoparticles. The SM-SERS sensitivity critically depends on plasmonic hot-spots created at the vicinity of such nanoparticles. In conventional fluid-phase SM-SERS experiments, plasmonic hot-spots are facilitated by chemical aggregation of nanoparticles. Such aggregation is usually irreversible, and hence, nanoparticles cannot be re-dispersed in the fluid for further use. Here, we show how to combine SM-SERS with plasmon polariton-assisted, reversible assembly of plasmonic nanoparticles at an unstructured metal–fluid interface. One of the unique features of our method is that we use a single evanescent-wave optical excitation for nanoparticle assembly, manipulation and SM-SERS measurements. Furthermore, by utilizing dual excitation of plasmons at metal–fluid interface, we create interacting assemblies of metal nanoparticles, which may be further harnessed in dynamic lithography of dispersed nanostructures. Our work will have implications in realizing optically addressable, plasmofluidic, single-molecule detection platforms. Plasmonic hot-spot generation in solution is not reversible for single-molecule surface-enhanced Raman scattering, which limits its applications. Patra et al.tackle this problem by integrating this technique with thermo-plasmon-assisted reconfiguration of nanoparticles at a metal–fluid interface.

/pdf/plasmofluidic-single-molecule-surface-enhanced-raman-39t0v43usg.pdf

Plasmofluidic single-molecule surface-enhanced Raman scattering from dynamic assembly of plasmonic nanoparticles

The fact that light carries both linear and angular momentum is well-known to physicists. One application of the linear momentum of light is for optical tweezers, in which the refraction of a laser beam through a particle provides a reaction force that draws the particle towards the centre of the beam. The angular momentum of light can also be transfered to particles, causing them to spin. In fact, the angular momentum of light has two components that act through different mechanisms on various types of particle. This Review covers the creation of such beams and how their unusual intensity, polarization and phase structure has been put to use in the field of optical manipulation.

Tweezers with a twist

The silicon chip has been the mainstay of the electronics industry for the last 40 years and has revolutionized the way the world operates. Today, a silicon chip the size of a fingernail contains nearly 1 billion transistors and has the computing power that only a decade ago would take up an entire room of servers. As the relentless pursuit of Moore's law continues, and Internet-based communication continues to grow, the bandwidth demands needed to feed these devices will continue to increase and push the limits of copper-based signaling technologies. These signaling limitations will necessitate optical-based solutions. However, any optical solution must be based on low-cost technologies if it is to be applied to the mass market. Silicon photonics, mainly based on SOI technology, has recently attracted a great deal of attention. Recent advances and breakthroughs in silicon photonic device performance have shown that silicon can be considered a material onto which one can build optical devices. While significant efforts are needed to improve device performance and commercialize these technologies, progress is moving at a rapid rate. More research in the area of integration, both photonic and electronic, is needed. The future is looking bright. Silicon photonics could provide low-cost opto-electronic solutions for applications ranging from telecommunications down to chip-to-chip interconnects, as well as emerging areas such as optical sensing technology and biomedical applications. The ability to utilize existing CMOS infrastructure and manufacture these silicon photonic devices in the same facilities that today produce electronics could enable low-cost optical devices, and in the future, revolutionize optical communications

http://ieeexplore.ieee.org/iel5/6668/34347/01638290.pdf

Silicon photonics

Raman spectroscopy permits probing of the molecular and chemical properties of the analyzed sample. However, its applicability has been seriously limited to specific applications by the presence of a strong fluorescence background. In our recent paper [Anal. Chem. 82, 738 (2010)], we reported a new modulation method for separating Raman scattering from fluorescence. By continuously changing the excitation wavelength, we demonstrated that it is possible to continuously shift the Raman peaks while the fluorescence background remains essentially constant. In this way, our method allows separation of the modulated Raman peaks from the static fluorescence background with important advantages when compared to previous work using only two [Appl. Spectrosc. 46, 707 (1992)] or a few shifted excitation wavelengths [Opt. Express 16, 10975 (2008)]. The purpose of the present work is to demonstrate a significant improvement of the efficacy of the modulated method by using different processing algorithms. The merits of each algorithm (Standard Deviation analysis, Fourier Filtering, Least-Squares fitting and Principal Component Analysis) are discussed and the dependence of the modulated Raman signal on several parameters, such as the amplitude and the modulation rate of the Raman excitation wavelength, is analyzed. The results of both simulation and experimental data demonstrate that Principal Component Analysis is the best processing algorithm. It improves the signal-to-noise ratio in the treated Raman spectra, reducing required acquisition times. Additionally, this approach does not require any synchronization procedure, reduces user intervention and renders it suitable for real-time applications.

Optimal algorithm for fluorescence suppression of modulated Raman spectroscopy.

Light induced dielectrophoresis (LIDEP) is a variant of the dielectrophoresis (DEP) mechanism that has been used for some time to manipulate particles in a microfluidic environment Rather than relying on lithographically created contacts to generate the required electrical fields, the electrical contacts in LIDEP are created through the selective illumination of a photoconductor The key question we address is how microscopic traps created via LIDEP compare to optical traps based on the gradient force, in terms of power required and trap stiffness achieved, as well as the size resolution of such a trap We highlight the complex interplay between optical power and resolution with electrical parameters, such as the electrical resistance and applied AC Voltage We show that for a spotsize of five micrometres and larger, particles can indeed be trapped with low power We use trap stiffness per mW to compare LIDEP with an optical trap and show that our system is 470± 94 times stiffer per mW than a conventional optical trap, with no loss of resolution We also discuss the difficulties of achieving trapping at smaller spot sizes, and that the sub-micron resolution possible with gradient force trapping is very difficult to realise with LIDEP

The resolution of optical traps created by Light Induced Dielectrophoresis (LIDEP)

The differential dispersion relation for the E and H modes (TM-like and TE-like, respectively) in planar photonic crystals is used to control the polarization-dependent propagation of light. E- and H-polarized beams were separated by 10 degrees after propagating through a 20-microm-long planar photonic crystal in the wavelength range from 1250 to 1300 nm. The plane-wave expansion calculation matches well with the experimental results. This result represents the first demonstration, to our knowledge, of a polarization splitter realized in a planar photonic crystal configuration in the near-infrared wavelength range operating solely in transmission mode.

Planar photonic crystal polarization splitter.

A model for a new electron-vortex beam production method is proposed and experimentally demonstrated. The technique calls on the controlled manipulation of the degrees of freedom of the lens aberrations to achieve a helical phase front. These degrees of freedom are accessible by using the corrector lenses of a transmission electron microscope. The vortex beam is produced through a particular alignment of these lenses into a specifically designed astigmatic state and applying an annular aperture in the condenser plane. Experimental results are found to be in good agreement with simulations.

https://dml.riken.jp/images/pub/nori/pdf/PhysRevLett.111.064801.pdf

Exploiting lens aberrations to create electron-vortex beams.

Scattering and absorption limit the penetration of optical fields into tissue. We demonstrate a new approach for increased depth penetration in light-sheet microscopy: attenuation-compensation of the light field. This tailors an exponential intensity increase along the illuminating propagation-invariant field, enabling the redistribution of intensity strategically within a sample to maximize signal and minimize irradiation. A key attribute of this method is that only minimal knowledge of the specimen transmission properties is required. We numerically quantify the imaging capabilities of attenuation-compensated Airy and Bessel light sheets, showing that increased depth penetration is gained without compromising any other beam attributes. This powerful yet straightforward concept, combined with the self-healing properties of the propagation-invariant field, improves the contrast-to-noise ratio of light-sheet microscopy up to eightfold across the entire field of view in thick biological specimens. This improvement can significantly increase the imaging capabilities of light-sheet microscopy techniques using Airy, Bessel, and other propagation-invariant beam types, paving the way for widespread uptake by the biomedical community.

/pdf/light-sheet-microscopy-with-attenuation-compensated-268wfuwugj.pdf

Michael Mazilu

Papers

Optimal algorithm for fluorescence suppression of modulated Raman spectroscopy.

The resolution of optical traps created by Light Induced Dielectrophoresis (LIDEP)

Planar photonic crystal polarization splitter.

Exploiting lens aberrations to create electron-vortex beams.

Light-sheet microscopy with attenuation-compensated propagation-invariant beams.