M
Michael Pecht
Researcher at University of Maryland, College Park
Publications - 1194
Citations - 38587
Michael Pecht is an academic researcher from University of Maryland, College Park. The author has contributed to research in topics: Prognostics & Reliability (statistics). The author has an hindex of 78, co-authored 1131 publications receiving 29099 citations. Previous affiliations of Michael Pecht include City University of Hong Kong & American Society of Mechanical Engineers.
Papers
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Book ChapterDOI
Experimental Validation of LS-SVM Based Fault Identification in Analog Circuits Using Frequency Features
TL;DR: A reliable and accurate (99 %) fault diagnostic framework consisting of a sweep signal generator, spectral estimator and a least squares-support vector machine is experimentally demonstrated.
Proceedings ArticleDOI
Electrochemical migration of land grid array sockets under highly accelerated stress conditions
Shuang Yang,Ji Wu,Michael Pecht +2 more
TL;DR: In this paper, a biased, highly accelerated stress testing (HAST) was conducted on metal-in-elastomer land grid array sockets and the potential chemical mechanism of silver electrochemical migration was described based upon the analysis of the ECM products.
Proceedings ArticleDOI
Room temperature soldering of microelectronic components for enhanced thermal performance
J.S. Subramanian,Peter Rodgers,Jesse Newson,Timothy Rude,Z. He,Etienne Besnoin,Timothy P. Weihs,Valerie Eveloy,Michael Pecht +8 more
TL;DR: In this paper, a fluxless soldering process is presented, that enables lead-free soldering of semiconductor die-to-heat spreader (and heat spreader-toheat sink structures) at room temperature.
Journal ArticleDOI
Fundamental reliability issues associated with a commercial particle-in-elastomer interconnection system
TL;DR: Recent studies by the CALCE Electronic Products and Systems Center in characterizing the materials and design properties of a commercially available (Thomas and Betts) metal particle-in-elastomer interconnection system revealed the potential failure modes and mechanisms of this elastomer socket, and can be used to select suitable application parameters when using this socket.
Journal ArticleDOI
Selective Dynamical Imaging of Interferometric Data
Joseph R. Farah,Peter Galison,Kazunori Akiyama,Katherine L. Bouman,Geoffrey C. Bower,Andrew Chael,Antonio Fuentes,José L. Gómez,Mareki Honma,Michael D. Johnson,Yutaro Kofuji,Daniel P. Marrone,Kotaro Moriyama,Ramesh Narayan,Dominic W. Pesce,Paul Tiede,Maciek Wielgus,Guang-Yao Zhao,A. Alberti,Walter Alef,Juan-Carlos Algaba,Richard Anantua,Keiichi Asada,Rebecca Azulay,A-K. Baczko,David Ball,Mislav Baloković,John E. Barrett,Bradford Benson,Dan Bintley,Lindy Blackburn,Ray Blundell,W. Boland,Hope Boyce,Michael Kremer,Christiaan D. Brinkerink,Roger Brissenden,Silke Britzen,Avery E. Broderick,Dominique Broguiere,Thomas Bronzwaer,Sandra Bustamente,Do-Young Byun,John E. Carlstrom,Chi-kwan Chan,Koushik Chatterjee,Shami Chatterjee,Ming-Tang Chen,Y. Chen 陈,Ilje Cho,Pierre Christian,John Conway,James M. Cordes,T. M. Crawford,Geoffrey B. Crew,Alejandro Cruz-Osorio,Yuzhu Cui,Jordy Davelaar,M. De Laurentis,Roger Deane,Jessica Dempsey,Gregory Desvignes,Sheperd S. Doeleman,R. P. Eatough,Heino Falcke,Vincent L. Fish,Ed Fomalont,H. A. Ford,Raquel Fraga-Encinas,Per Friberg,Christian M. Fromm,Charles F. Gammie,Roberto Garc’a,Olivier Gentaz,Ciriaco Goddi,Roman Gold,Arturo I. Gómez-Ruiz,M. Gu 顾,Mark Gurwell,Kazuhiro Hada,Daryl Haggard,Michael Pecht,Ronald Hesper,L. Ho 何,Paul T. P. Ho,Chih-Wei Locutus Huang,L. Huang 黄,David H. Hughes,Shiro Ikeda,Makoto Inoue,Sara Issaoun,David J. James,Buell T. Jannuzi,Michael Janssen,Britton Jeter,Wu 悟 Jiang 江,A. Jiménez-Rosales,Svetlana G. Jorstad,Taehyun Jung,Mansour Karami,Ramesh Karuppusamy,Tomohisa Kawashima,Garrett K. Keating,Mark Kettenis,Donghyun Kim,Jae-Young Kim,Jongsoo Kim,Junhan Kim,Motoki Kino,Jun Yi Koay,Patrick M. Koch,Shoko Koyama,Carsten Kramer,Michael Kramer,Thomas P. Krichbaum,C. Y. Kuo,Tod R. Lauer,Sang-Sung Lee,Aviad Levis,YanRong Li,Z. Li 李,Rocco Lico,Greg Lindahl,Michael Lindqvist,J. Liu 刘,Kuo Liu,Elisabetta Liuzzo,W. Lo,Andrei Lobanov,Laurent Loinard,C. Lonsdale,R. Lu 路,Nicholas R. MacDonald,J. Mao 毛,Nicola Marchili,Sera Markoff,Alan P. Marscher,Ivan Marti-Vidal,Satoki Matsushita,Lynn D. Matthews,Lia Medeiros,Karl M. Menten,Izumi Mizuno,Yosuke Mizuno,James M. Moran,Monika Moscibrodzka,Cornelia Müller,Alejandro Mus Mejas,Gibwa Musoke,Hiroshi Nagai,Neil M. Nagar,Masanori Nakamura,Gopal Narayanan,Iniyan Natarajan,Antonios Nathanail,Joseph Neilsen,R. Neri,Chunchong Ni,A. Noutsos,Michael A. Nowak,Hiroki Okino,Hector Olivares,Gisela N. Ortiz-León,Tomoaki Oyama,Feryal zel,Daniel C. M. Palumbo,Jong-Ho Park,Nimesh A. Patel,Ue Li Pen,Vincent Piétu,Richard L. Plambeck,Aleksandar Popstefanija,Oliver Porth,Felix M. Pötzl,Ben Prather,Jorge A. Preciado-López,Dimitrios Psaltis,Hung-Yi Pu,Venkatessh Ramakrishnan,Ramprasad Rao,Mark G. Rawlings,Alexander W. Raymond,Luciano Rezzolla,Bart Ripperda,Freek Roelofs,Alan E. E. Rogers,E. Ros,Mel Rose,Arash Roshanineshat,Helge Rottmann,Alan L. Roy,Chet Ruszczyk,Kazi L.J. Rygl,S. Sánchez,David Sánchez-Arguelles,Mahito Sasada,Tuomas Savolainen,F. Peter Schloerb,Karl Schuster,Lijing Shao,Z. Shen 沈,Des Small,Bong Won Sohn,Jason SooHoo,H. Sun 孙,Fumie Tazaki,Alexandra J. Tetarenko,Remo P. J. Tilanus,Michael Titus,Kenji Toma,Pablo Torne,Efthalia Traianou,Tyler Trent,Sascha Trippe,I. van Bemmel,H. J. van Langevelde,Daniel R. van Rossum,Jan Wagner,Derek Ward-Thompson,John F. C. Wardle,Jonathan Weintroub,Norbert Wex,Robert Wharton,Kaj Wiik,George N. Wong,Doosoo Yoon,André Young,Ken H. Young,Ziri Younsi,F. Yuan 袁,Y. Yuan 袁,J. A. Zensus,Sha Zhao +232 more
TL;DR: In this paper , the authors derive a metric of coverage quality based on baseline isotropy and density that is capable of ranking array configurations by their ability to produce accurate dynamical reconstructions.