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Miklós Mohai

Researcher at Hungarian Academy of Sciences

Publications -  117
Citations -  2438

Miklós Mohai is an academic researcher from Hungarian Academy of Sciences. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Surface modification. The author has an hindex of 22, co-authored 107 publications receiving 2111 citations. Previous affiliations of Miklós Mohai include Chemical Research Center of the Hungarian Academy of Sciences.

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Surface characterisation of plasma-nitrided titanium: an XPS study

TL;DR: In this paper, a DC plasma nitriding was applied to titanium metal sheets in a commercial cell using Ar + NH3 as the admixture and the nitrided surface investigated by means of XPS.
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XPS MultiQuant: multimodel XPS quantification software

TL;DR: XPS MultiQuant as discussed by the authors is a program for quantitative evaluation of x-ray photoelectron spectra that uses the classic approach of quantification and requires as input the integrated intensities of the measured XPS lines.
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Surface modification of graphene and graphite by nitrogen plasma: Determination of chemical state alterations and assignments by quantitative X-ray photoelectron spectroscopy

TL;DR: In this paper, X-ray photoelectron spectroscopy (XPS) was used to delineate surface composition and chemical state alterations of multilayer graphene and its bulk analog, highly oriented pyrolytic graphite (HOPG).
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A comparative study of solid sulfonic acid catalysts based on various ordered mesoporous silica materials

TL;DR: In this paper, ordered mesoporous silica materials (MCM-41, HMS, and SBS-15) with covalently anchored propanesulfonic or benzenesulfonic acid groups were synthesized.
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Effects of Bivalent Cations on Corrosion Inhibition of Steel by 1‐Hydroxyethane‐1,1‐diphosphonic Acid

TL;DR: In this article, the influence of calcium and zinc ions on the corrosion inhibition effect of 1−hydroxyethane•1,1-diphosphonic acid (HEDP) on carbon steel has been investigated by electrochemical techniques, X-ray photoelectron spectroscopy, and atomic force microscopy.