M
Min-Hwan Jeon
Researcher at Sungkyunkwan University
Publications - 9
Citations - 341
Min-Hwan Jeon is an academic researcher from Sungkyunkwan University. The author has contributed to research in topics: Thin film & Reactive-ion etching. The author has an hindex of 6, co-authored 9 publications receiving 275 citations.
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Journal ArticleDOI
Low‐Temperature Synthesis of Large‐Scale Molybdenum Disulfide Thin Films Directly on a Plastic Substrate Using Plasma‐Enhanced Chemical Vapor Deposition
Chisung Ahn,Jinhwan Lee,Hyeong-U Kim,Hunyoung Bark,Min-Hwan Jeon,Gyeong Hee Ryu,Zonghoon Lee,Geun Young Yeom,Kwangsu Kim,Jaehyuck Jung,Young Seok Kim,Changgu Lee,Taesung Kim +12 more
TL;DR: By plasma-enhanced chemical vapor deposition, a molybdenum disulfide (MoS2) thin film is synthesized directly on a wafer-scale plastic substrate at below 300 °C, revealing its potential for flexible sensing devices.
Journal ArticleDOI
Controlled Layer-by-Layer Etching of MoS₂.
Lin Taizhe,Lin Taizhe,Baotao Kang,Min-Hwan Jeon,Craig Huffman,JeaHoo Jeon,Sungjoo Lee,Wei Han,Jin Yong Lee,Sehan Lee,Geun Young Yeom,Kyong-nam Kim +11 more
TL;DR: A layer-by-layer removal of MoS2 is proposed using the atomic layer etching (ALET) that is composed of the cyclic processing of chlorine (Cl)-radical adsorption and argon (Ar)(+) ion-beam desorption.
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In situ synthesis of MoS2 on a polymer based gold electrode platform and its application in electrochemical biosensing
Hyeong-U Kim,Hyeyoun Kim,Chisung Ahn,Atul Kulkarni,Min-Hwan Jeon,Geun Young Yeom,Min-Ho Lee,Taesung Kim +7 more
TL;DR: In this paper, the negative charges carried by the layered MoS2 are used to immobilize horseradish peroxidase conjugated IgG via the electrostatic attraction, forming an Au-MoS2/HRP hybrid.
Journal ArticleDOI
Etching of CoFeB Using CO ∕ NH3 in an Inductively Coupled Plasma Etching System
TL;DR: In this article, a CoFeB thin film composing a magnetic tunneling junction was etched in an inductively coupled plasma (ICP) etching system using CO/NH 3 gas mixtures.
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Etch Damage of Ge$_{2}$Sb$_{2}$Te$_{5}$ for Different Halogen Gases
TL;DR: Etch damage of Ge2Sb2Te5 (GST) has been investigated after etching in halogen inductively coupled plasmas (ICPs) such as CF4, Cl2, and HBr as discussed by the authors.