M
Minho Kwon
Researcher at Yonsei University
Publications - 12
Citations - 85
Minho Kwon is an academic researcher from Yonsei University. The author has contributed to research in topics: Delta-sigma modulation & CMOS. The author has an hindex of 5, co-authored 12 publications receiving 84 citations. Previous affiliations of Minho Kwon include Samsung.
Papers
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Patent
Offset Canceling Circuit, Sampling Circuit and Image Sensor
TL;DR: An offset canceling circuit stores charge corresponding to a voltage difference between a reset voltage received from a unit pixel and a reference voltage, thereby canceling an offset of the unit pixel.
Patent
Analog-to-digital converter and image sensor including the same
TL;DR: In this article, the analog-to-digital converter includes a modulation unit and a digital signal generation unit, and the modulation unit is disposed corresponding to at least one column line, and sequentially performs delta-sigma modulation on an analog input signal and at least 1 residue voltage to generate digital bit stream signals.
Journal ArticleDOI
An I/Q -Channel Time-Interleaved Bandpass Sigma–Delta Modulator for a Low-IF Receiver
Minho Kwon,Gunhee Han +1 more
TL;DR: This brief proposes a multiplexing scheme to realize an I/Q-channel time-interleaved (TI) bandpass sigma-delta modulator that shares operational transconductance amplifiers to minimize power consumption and silicon area for a low-intermediate-frequency (IF) wireless receiver.
Journal ArticleDOI
A time-interleaved recursive loop band-pass delta-sigma modulator for a digital IF CDMA receiver
TL;DR: A time-interleaved recursive loop BPDSM architecture that consists of five-stage TI blocks for a code-division multiple-access (CDMA) receiver is proposed that provides reduction in the clock frequency requirement by a factor of 5 and relaxes the settling time requirement to one-fourth of the conventional approach.
Journal Article
Built-in Self-Test Implementation for an Analog-to-Digital Converter
Kwisung Yoo,Minho Kwon,Geumhwan Bahng,Sangyun Hwang,Hoon Lee,Jungyoon Lee,Daesik Seo,Jaeseok Kim,Sungho Kang,Gunhee Han +9 more
TL;DR: Simulation results show that the proposed ADC BIST scheme can detect not only catastrophic faults but also some parametric faults and the total gate count of the proposed BIST circuit is about 150.