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Minho Kwon

Researcher at Yonsei University

Publications -  12
Citations -  85

Minho Kwon is an academic researcher from Yonsei University. The author has contributed to research in topics: Delta-sigma modulation & CMOS. The author has an hindex of 5, co-authored 12 publications receiving 84 citations. Previous affiliations of Minho Kwon include Samsung.

Papers
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Patent

Offset Canceling Circuit, Sampling Circuit and Image Sensor

TL;DR: An offset canceling circuit stores charge corresponding to a voltage difference between a reset voltage received from a unit pixel and a reference voltage, thereby canceling an offset of the unit pixel.
Patent

Analog-to-digital converter and image sensor including the same

TL;DR: In this article, the analog-to-digital converter includes a modulation unit and a digital signal generation unit, and the modulation unit is disposed corresponding to at least one column line, and sequentially performs delta-sigma modulation on an analog input signal and at least 1 residue voltage to generate digital bit stream signals.
Journal ArticleDOI

An I/Q -Channel Time-Interleaved Bandpass Sigma–Delta Modulator for a Low-IF Receiver

TL;DR: This brief proposes a multiplexing scheme to realize an I/Q-channel time-interleaved (TI) bandpass sigma-delta modulator that shares operational transconductance amplifiers to minimize power consumption and silicon area for a low-intermediate-frequency (IF) wireless receiver.
Journal ArticleDOI

A time-interleaved recursive loop band-pass delta-sigma modulator for a digital IF CDMA receiver

TL;DR: A time-interleaved recursive loop BPDSM architecture that consists of five-stage TI blocks for a code-division multiple-access (CDMA) receiver is proposed that provides reduction in the clock frequency requirement by a factor of 5 and relaxes the settling time requirement to one-fourth of the conventional approach.
Journal Article

Built-in Self-Test Implementation for an Analog-to-Digital Converter

TL;DR: Simulation results show that the proposed ADC BIST scheme can detect not only catastrophic faults but also some parametric faults and the total gate count of the proposed BIST circuit is about 150.