N
Nicholas W. M. Ritchie
Researcher at National Institute of Standards and Technology
Publications - 117
Citations - 5894
Nicholas W. M. Ritchie is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Microanalysis & Scanning electron microscope. The author has an hindex of 17, co-authored 110 publications receiving 5435 citations.
Papers
More filters
Book
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein,Dale E. Newbury,J. R. Michael,Nicholas W. M. Ritchie,John Henry J. Scott,David C. Joy +5 more
Journal ArticleDOI
Is Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry (SEM/EDS) Quantitative?
TL;DR: Scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) is a widely applied elemental microanalysis method capable of identifying and quantifying all elements in the periodic table except H, He, and Li, but measurement issues continue to diminish the impact.
Journal ArticleDOI
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)
TL;DR: Accurate analyses of low atomic number elements, C, N, O, and F, are demonstrated and measurement of trace constituents with limits of detection below 0.001 mass fraction is possible within a practical measurement time of 500 s.
Journal ArticleDOI
Spectrum simulation in DTSA-II.
TL;DR: DTSA-II, software for electron probe microanalysis, provides both easy to use and flexible tools for simulating common and less common sample geometries and materials and provides tools for visualizing, comparing, manipulating, and quantifying simulated and measured spectra.
Journal ArticleDOI
A new Monte Carlo application for complex sample geometries
TL;DR: NISTMonte as discussed by the authors is a new application for Monte Carlo simulation of electron transport, X-ray generation and transmission in complex sample geometries using Mott cross section and Joy-Luo expression.