O
Omer Wagner
Researcher at Bar-Ilan University
Publications - 21
Citations - 158
Omer Wagner is an academic researcher from Bar-Ilan University. The author has contributed to research in topics: Point spread function & Microscopy. The author has an hindex of 5, co-authored 18 publications receiving 132 citations.
Papers
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Journal ArticleDOI
Imaging of nanoparticle dynamics in live and apoptotic cells using temporally-modulated polarization.
Omer Wagner,Moty Schultz,Eitan Edri,Rinat Meir,Eran A. Barnoy,Amihai Meiri,Hagay Shpaisman,Eli Sloutskin,Zeev Zalevsky +8 more
TL;DR: By modulating the light polarization and taking advantage of the polarization-dependence of gold nanorod optical properties, the ‘lock-in amplification’, widely-used in electronic engineering, is realized to achieve image enhancement in live cells and in cells that undergo apoptotic changes.
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Color image identification and reconstruction using artificial neural networks on multimode fiber images: towards an all-optical design.
TL;DR: This work proposes the design of an optical ANN-based imaging system that has the ability to self-study image signals from an incoherent light source in different colors and shows that the signals transmitted through the multimode fiber can be used for image identification purposes and can be reconstructed using ANNs with a low number of nodes.
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Superresolved imaging based on wavelength multiplexing of projected unknown speckle patterns
TL;DR: In this paper, a method for resolution enhancement of a diffraction limited optical system based on the capture of a set of low-resolution images is proposed, which is obtained after projection of an ensemble of unknown speckle patterns on top of the high resolution object that is to be imaged.
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Plasma dispersion effect based super-resolved imaging in silicon.
TL;DR: This shaping method is proposed to overcome the diffraction resolution limit in silicon microscopy on and deep under the silicon surface.
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Optical-tweezing-based linear-optics nanoscopy.
TL;DR: As the first proof of concept, this method successfully resolved sample characteristic features down to 100 nm and encodes super-resolution information, which is decode by post image processing, with the trapped particle locations predetermined.