O
Ondrej L. Krivanek
Researcher at Arizona State University
Publications - 232
Citations - 11269
Ondrej L. Krivanek is an academic researcher from Arizona State University. The author has contributed to research in topics: Scanning transmission electron microscopy & Electron energy loss spectroscopy. The author has an hindex of 45, co-authored 227 publications receiving 10224 citations. Previous affiliations of Ondrej L. Krivanek include Rice University & University of California, Berkeley.
Papers
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Probing Biological Materials by Vibrational Analysis in the Electron Microscope
Ondrej L. Krivanek,Benedikt Haas,Zdravko Kochovski,Johannes Müller,Christoph Koch,Katia March,Alice Dohnalkova,Niklas Dellby,M.T. Hotz,Benjamin Plotkin-Swing,Tracy C. Lovejoy,Peter Rez +11 more
TL;DR: Krivanek et al. as mentioned in this paper proposed a method to solve the problem of energy minimization in the context of materials and energy, and showed that it is possible to achieve energy minimisation in terms of energy efficiency.
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STEM-EDXS System for Atomic-Sensitivity Elemental Mapping
Tracy C. Lovejoy,Rhonda M. Stroud,Nabil Bassim,G.J. Corbin,Niklas Dellby,W. Hahn,P. Hrncirik,Meiken Falke,A. Kaeppel,M Rohde,Ondrej L. Krivanek +10 more
TL;DR: The Nion UltraSTEM aberration-corrected cold field emission scanning transmission electron microscope (AC-CFE-STEM) as discussed by the authors can focus a beam current of about 0.2 nA into an atom-sized (~1.5 Å large) probe at a primary energy of 60 keV and about 1 nA at 200 keV.
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John C.H. Spence – friend, teacher, mentor, scientific pioneer and visionary
TL;DR: In this article , the authors present an abstract for this paper and a preview of a full PDF is available via the ‘Save PDF’ action button in order to access the full abstract.
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Transmission EXELFS: Temperature dependence
TL;DR: In this article, the authors demonstrate the excellent quality of the parallel detection EXELFS signal by examining the variation of the amplitude with temperature for a thin aluminum foil and show that the signal quality and radiation damage effects are similar to those obtained in EXAFS spectra for samples which cannot be examined by transmission x-ray absorption.