O
Ondrej L. Krivanek
Researcher at Arizona State University
Publications - 232
Citations - 11269
Ondrej L. Krivanek is an academic researcher from Arizona State University. The author has contributed to research in topics: Scanning transmission electron microscopy & Electron energy loss spectroscopy. The author has an hindex of 45, co-authored 227 publications receiving 10224 citations. Previous affiliations of Ondrej L. Krivanek include Rice University & University of California, Berkeley.
Papers
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Journal ArticleDOI
Progress in ultrahigh energy resolution EELS.
Ondrej L. Krivanek,Niklas Dellby,Jordan A. Hachtel,Juan C. Idrobo,M.T. Hotz,Benjamin Plotkin-Swing,N.J. Bacon,Andrew Bleloch,G.J. Corbin,M.V. Hoffman,C.E. Meyer,Tracy C. Lovejoy +11 more
TL;DR: Advances in monochromator and spectrometer design have improved the energy resolution attainable in a scanning transmission electron microscope to 4.2 meV, and new applications of ultrahigh energy resolution EELS have not lagged behind.
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Spatial resolution in EFTEM elemental maps
TL;DR: In this paper, the authors explore the attainable spatial resolution in the elemental maps theoretically and experimentally, and suggest optimized set-up procedures for maximizing the resolution of the resolution.
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Elnes of 3d transition-metal oxides: I. Variations across the periodic table
TL;DR: In this article, the multiplet splittings in energy-loss near-edge structure (ELNES) of the metal L2,3 edge of transition-metal oxides are investigated.
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Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy
Juan Carlos Idrobo,Andrew R. Lupini,Tianli Feng,Tianli Feng,Raymond R. Unocic,Franklin S. Walden,Daniel Stephen Gardiner,Tracy C. Lovejoy,Niklas Dellby,Sokrates T. Pantelides,Sokrates T. Pantelides,Ondrej L. Krivanek +11 more
TL;DR: In this paper, a method that combines electron energy gain and loss spectroscopy to provide a direct measurement of the local temperature in the nanoenvironment was proposed, where both loss and gain peaks exhibit a shift towards lower energies as the sample is heated up.
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Single-defect phonons imaged by electron microscopy.
Xingxu Yan,Chengyan Liu,Chengyan Liu,Chaitanya Gadre,Lei Gu,Toshihiro Aoki,Tracy C. Lovejoy,Niklas Dellby,Ondrej L. Krivanek,Darrell G. Schlom,Darrell G. Schlom,Ruqian Wu,Xiaoqing Pan +12 more
TL;DR: In this paper, the authors demonstrate that the capabilities of a transmission electron microscope open the door to direct mapping of phonon propagation around defects, which is expected to provide useful guidance for engineering thermal properties of materials.