P
P. Paul Ruden
Researcher at University of Minnesota
Publications - 179
Citations - 5359
P. Paul Ruden is an academic researcher from University of Minnesota. The author has contributed to research in topics: Electron mobility & Field-effect transistor. The author has an hindex of 36, co-authored 178 publications receiving 5068 citations. Previous affiliations of P. Paul Ruden include United States Naval Research Laboratory & Max Planck Society.
Papers
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Percolation model for the threshold voltage of field-effect transistors with nanocrystalline channels
I. P. Steinke,P. Paul Ruden +1 more
TL;DR: In this article, the authors present a model for determining the threshold voltage of field effect transistors with nanocrystalline active channel layers, where the multiple boundaries between neighboring crystalline grains limit the charge-carrier transport.
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Electrical and magnetic characteristics of MBE-grown GaMnN
TL;DR: In this paper, magnetometry and charge transport data for a GaMnN film with approximately 7% (atomic) Mn grown by molecular beam epitaxy were presented, which is consistent with the existence of ferromagnetism up to 300 K.
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Effects of disorder on spin injection and extraction for organic semiconductor spin-valves
TL;DR: In this paper, a device model for tunnel injection and extraction of spin-polarized charge carriers between ferromagnetic contacts and organic semiconductors with disordered molecular states is presented.
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Monte Carlo modeling of wurtzite and 4H phase semiconducting materials
Kevin F. Brennan,Enrico Bellotti,Maziar Farahmand,Hans-Erik Nilsson,P. Paul Ruden,Yumin Zhang +5 more
TL;DR: It is found that the band intersection points present the greatest modeling challenge, and initial attempts at treating transport near these points are made.
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Current versus voltage characteristics of GaN∕AlGaN∕GaN double heterostructures with varying AlGaN thickness and composition under hydrostatic pressure
TL;DR: In this paper, the authors investigated the effect of AlGaN layer thickness and composition on the pressure sensitivity of double heterostructure devices under hydrostatic pressure up to 500MPa.