P
P. Yang
Researcher at Texas Instruments
Publications - 46
Citations - 1863
P. Yang is an academic researcher from Texas Instruments. The author has contributed to research in topics: Electronic circuit & Very-large-scale integration. The author has an hindex of 19, co-authored 46 publications receiving 1844 citations.
Papers
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Journal ArticleDOI
A Monte Carlo approach for power estimation
TL;DR: A power estimation technique for VLSI that combines the accuracy of simulation-based techniques with the speed of the probabilistic techniques, and the superiority of the approach is discussed.
Journal ArticleDOI
Multilevel metal capacitance models for CAD design synthesis systems
TL;DR: An empirical model for multilevel interconnect capacitance that allows designers to compute capacitances of arbitrary complex metal geometries by a novel strategy of constructing complex geometry from simple primitive cells is presented.
Journal ArticleDOI
Probabilistic simulation for reliability analysis of CMOS VLSI circuits
TL;DR: A current-estimation approach to support the analysis of electromigration (EM) failures in power supply and ground buses of CMOS VLSI circuits is discussed and has shown excellent accuracy and dramatic speedups compared with traditional approaches.
Patent
Low voltage triggering semiconductor controlled rectifiers
TL;DR: In this article, a new semiconductor controlled rectifier which may be used to provide on-chip protection against ESD stress applied at the input, output, power supply pins or between any arbitrary pair of pins of an integrated circuit is disclosed.
Journal ArticleDOI
Parametric yield optimization for MOS circuit blocks
D.E. Hocevar,P.F. Cox,P. Yang +2 more
TL;DR: Two techniques are presented for optimizing the parametric yield of digital MOS circuit blocks for VLSI designs based on quasi-Newton methods and utilizes the gradient of the yield.