Showing papers by "Paolo Stefano Crovetti published in 2011"
TL;DR: It is highlighted that the injected bulk current estimated by the calibration procedure described in the standard is significantly different from the actual bulk current injected into the EUT connector during BCI tests above 100MHz.
Abstract: The closed-loop bulk current injection (BCI) method employed to measure the immunity to electromagnetic interference of an electronic equipment in compliance with the ISO 11452-4 standard is critically assessed on the basis of an experimental characterization of its test setup. It is highlighted that, above 100 MHz, the injected bulk current estimated by the calibration procedure described in the standard is significantly different from the actual bulk current injected into the connector of the equipment under test (EUT) during BCI tests. Such a discrepancy gives rise to unreliable BCI immunity test results highlighting susceptibility issues that are not related with the actual susceptibility of the EUT.
23 citations
TL;DR: In this article, the authors investigated the mechanisms that lead to the conversion of commonmode (CM) RF interference into differential-mode (DM) disturbances, which corrupt the information content of nominal signals and impair the operation of electronic systems.
Abstract: In this paper, the mechanisms that lead to the conversion of common-mode (CM) RF interference (RFI) into differential-mode (DM) disturbances, which corrupt the information content of nominal signals and impair the operation of electronic systems, are investigated. To this purpose, distributed and lumped common-mode into differential-mode (CM-DM) conversion mechanisms are discussed with reference to a simple test structure that can be analytically described. On the basis of the proposed analysis, the origin and the relative impact of such mechanisms is highlighted and the detrimental effect of distributed CM-DM conversion on the effectiveness of differential RFI suppressing filters is discussed. Theoretical predictions are compared with experimental results.
18 citations
Proceedings Article•
15 Nov 2011TL;DR: In this article, the susceptibility of the Hall effect sensor to electromagnetic interference was evaluated by comparing the results of measurements carried out on the Hall sensor in different configurations, and it was shown that EMI-induced failures in the Hall-effect sensor operation are highlighted.
Abstract: In this paper, the susceptibility to electromagnetic interference of Hall effect sensors is experimentally assessed. To this purpose, Bulk Current Injection and TEM cell Electromagnetic Interference immunity measurements are performed on a test board including a commercial Hall sensor for current monitoring. From such measurements, EMI-induced failures in the Hall effect sensor operation are highlighted. Moreover, the particular susceptibility of the Hall effect sensor to a tangential RF electric field excitation is highlighted by comparing the results of measurements carried out on the Hall sensor in different configurations.
10 citations
TL;DR: It is highlighted that fully differential nonlinear circuits, even though perfectly symmetrical, can be significantly sensitive to common-mode (CM)/power-supply (PS) interference and can be affected by even-order distortion.
Abstract: In this brief, it is highlighted that fully differential nonlinear circuits, even though perfectly symmetrical, can be significantly sensitive to common-mode (CM)/power-supply (PS) interference and can be affected by even-order distortion. The cross-modulation mechanism between CM and differential input components, which gives rise to such unwanted phenomena, is investigated both analytically and on the basis of computer simulations, and its impact on CM and PS rejection is compared with the effects of device mismatch.
8 citations