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Showing papers by "Paul W. Marshall published in 2015"

Journal Article•DOI•
New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle

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Nathaniel A. Dodds1, Paul E. Dodd1, Marty R. Shaneyfelt1, Frederick W. Sexton1, Marino Martinez1, Jeffrey D. Black1, Paul W. Marshall, Robert A. Reed2, Michael W. McCurdy2, Robert A. Weller2, J. A. Pellish3, Kenneth P. Rodbell4, M.S. Gordon4 •
Sandia National Laboratories1, Vanderbilt University2, Goddard Space Flight Center3, IBM4
17 Dec 2015-IEEE Transactions on Nuclear Science
TL;DR: In this article, low-energy proton single-event upset (SEU) data on a 65 nm SOI SRAM whose substrate has been completely removed is presented, and the results show a strong angular dependence, demonstrate that energy straggle, flux attrition, and angular scattering affect the measured SEU cross sections, and prove that proton direct ionization is the dominant mechanism for low energy proton induced SEUs in these circuits.
Abstract: In this study, we present low-energy proton single-event upset (SEU) data on a 65 nm SOI SRAM whose substrate has been completely removed. Since the protons only had to penetrate a very thin buried oxide layer, these measurements were affected by far less energy loss, energy straggle, flux attrition, and angular scattering than previous datasets. The minimization of these common sources of experimental interference allows more direct interpretation of the data and deeper insight into SEU mechanisms. The results show a strong angular dependence, demonstrate that energy straggle, flux attrition, and angular scattering affect the measured SEU cross sections, and prove that proton direct ionization is the dominant mechanism for low-energy proton-induced SEUs in these circuits.

20 citations