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Peter M. Baldo

Researcher at Argonne National Laboratory

Publications -  121
Citations -  2733

Peter M. Baldo is an academic researcher from Argonne National Laboratory. The author has contributed to research in topics: Irradiation & Thin film. The author has an hindex of 27, co-authored 119 publications receiving 2497 citations. Previous affiliations of Peter M. Baldo include Peking University.

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Functional links between stability and reactivity of strontium ruthenate single crystals during oxygen evolution.

TL;DR: An intimate relationship between the stability and reactivity of oxide catalysts is reported in exploring the reaction on strontium ruthenate single-crystal thin films in alkaline environments.
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Grain-size-dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia films grown by metal-organic chemical vapor deposition

TL;DR: A grain-size-dependent reduction in the room-temperature thermal conductivity of nanocrystalline yttria-stabilized zirconia is reported for the first time as discussed by the authors.
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Substrate effects on the structure of epitaxial PbTiO3 thin films prepared on MgO, LaAlO3, and SrTiO3 by metalorganic chemical‐vapor deposition

TL;DR: In this paper, PbTiO3 films were prepared by metalorganic chemical-vapor deposition on MgO(001) and LaAlO3 (001) oriented substrates, and the defect structure of the films, including grain tilting, threading dislocation density and 90° domain formation, was strongly dependent on the choice of substrate material.
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In situ characterization of strontium surface segregation in epitaxial La0.7Sr0.3MnO3 thin films as a function of oxygen partial pressure

TL;DR: Using in situ synchrotron measurements of total reflection x-ray fluorescence, this article found evidence of strontium surface segregation in (001)-oriented La0.7Sr0.3MnO3 thin films over a wide range of temperatures and oxygen partial pressures.
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Study of defect evolution by TEM with in situ ion irradiation and coordinated modeling

TL;DR: In this article, the authors describe a novel transmission electron microscopy (TEM) experiment with in situ ion irradiation designed to improve and validate a computer model and obtain accurate, quantitative measurements of defect number density and size distribution.