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Piotr Skurski

Researcher at University of Gdańsk

Publications -  174
Citations -  4898

Piotr Skurski is an academic researcher from University of Gdańsk. The author has contributed to research in topics: Ab initio & Binding energy. The author has an hindex of 38, co-authored 167 publications receiving 4595 citations. Previous affiliations of Piotr Skurski include Pacific Northwest National Laboratory & University of Utah.

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Mechanism for Damage to DNA by Low-Energy Electrons †

TL;DR: In this paper, the authors carried out ab initio electronic structure calculations on a portion of DNA, the results of which provide support for a mechanism that produces single-strand breaks (SSBs) with low-energy electrons.
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The Only Stable State of O2- Is the X 2Πg Ground State and It (Still!) Has an Adiabatic Electron Detachment Energy of 0.45 eV

TL;DR: In this paper, a Franck−Condon simulation of the neutral oxygen states was performed to determine the potential energy curves of O2 and O2- in its ground state and two excited states, in both the electronically bound and unbound regions.
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Damage to model DNA fragments from very low-energy (<1 eV) electrons.

TL;DR: The findings of the present work suggest that, while DNA bases can attach electrons having kinetic energies in the 1 eV range and subsequently undergo phosphate-sugar O-C sigma bond cleavage, it is highly unlikely (in contrast to recent suggestions) that electronsHaving kinetic energies near 0 eV can attach to the phosphate unit's P=O bonds.
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Contribution of electron correlation to the stability of dipole-bound anionic states.

TL;DR: High-level electronic structure calculations on the dipole-bound anion states of CH 3CN, C 3H 2, and C 5H 2 reveal that for these species a large fraction of the electron binding energy derives from the dispersion-type interaction between the loosely bound electron and the neutral molecule.
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Coulomb-Assisted Dissociative Electron Attachment: Application to a Model Peptide

TL;DR: The results presented here seem to offer good insight into one aspect of the ECD process, and they provide a means by which one can estimate which bonds may be susceptible to cleavage by low-energy electron attachment.