This paper describes the contents of the 2016 edition of the HITRAN molecular spectroscopic compilation. The new edition replaces the previous HITRAN edition of 2012 and its updates during the intervening years. The HITRAN molecular absorption compilation is composed of five major components: the traditional line-by-line spectroscopic parameters required for high-resolution radiative-transfer codes, infrared absorption cross-sections for molecules not yet amenable to representation in a line-by-line form, collision-induced absorption data, aerosol indices of refraction, and general tables such as partition sums that apply globally to the data. The new HITRAN is greatly extended in terms of accuracy, spectral coverage, additional absorption phenomena, added line-shape formalisms, and validity. Moreover, molecules, isotopologues, and perturbing gases have been added that address the issues of atmospheres beyond the Earth. Of considerable note, experimental IR cross-sections for almost 300 additional molecules important in different areas of atmospheric science have been added to the database. The compilation can be accessed through www.hitran.org. Most of the HITRAN data have now been cast into an underlying relational database structure that offers many advantages over the long-standing sequential text-based structure. The new structure empowers the user in many ways. It enables the incorporation of an extended set of fundamental parameters per transition, sophisticated line-shape formalisms, easy user-defined output formats, and very convenient searching, filtering, and plotting of data. A powerful application programming interface making use of structured query language (SQL) features for higher-level applications of HITRAN is also provided.

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The HITRAN 2008 molecular spectroscopic database

Fundamentals of Plasmonics.- Electromagnetics of Metals.- Surface Plasmon Polaritons at Metal / Insulator Interfaces.- Excitation of Surface Plasmon Polaritons at Planar Interfaces.- Imaging Surface Plasmon Polariton Propagation.- Localized Surface Plasmons.- Electromagnetic Surface Modes at Low Frequencies.- Applications.- Plasmon Waveguides.- Transmission of Radiation Through Apertures and Films.- Enhancement of Emissive Processes and Nonlinearities.- Spectroscopy and Sensing.- Metamaterials and Imaging with Surface Plasmon Polaritons.- Concluding Remarks.

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Plasmonics: Fundamentals and Applications

Since the first application of the surface plasmon resonance (SPR) phenomenon for sensing almost two decades ago, this method has made great strides both in terms of instrumentation development and applications. SPR sensor technology has been commercialized and SPR biosensors have become a central tool for characterizing and quantifying biomolecular interactions. This paper attempts to review the major developments in SPR technology. Main application areas are outlined and examples of applications of SPR sensor technology are presented. Future prospects of SPR sensor technology are discussed.

Surface plasmon resonance sensors: review

We present models for the optical functions of 11 metals used as mirrors and contacts in optoelectronic and optical devices: noble metals (Ag, Au, Cu), aluminum, beryllium, and transition metals (Cr, Ni, Pd, Pt, Ti, W). We used two simple phenomenological models, the Lorentz-Drude (LD) and the Brendel-Bormann (BB), to interpret both the free-electron and the interband parts of the dielectric response of metals in a wide spectral range from 0.1 to 6 eV. Our results show that the BB model was needed to describe appropriately the interband absorption in noble metals, while for Al, Be, and the transition metals both models exhibit good agreement with the experimental data. A comparison with measurements on surface normal structures confirmed that the reflectance and the phase change on reflection from semiconductor-metal interfaces (including the case of metallic multilayers) can be accurately described by use of the proposed models for the optical functions of metallic films and the matrix method for multilayer calculations.

Optical properties of metallic films for vertical-cavity optoelectronic devices.

We experimentally demonstrate a perfect plasmonic absorber at λ = 1.6 μm. Its polarization-independent absorbance is 99% at normal incidence and remains very high over a wide angular range of incidence around ±80°. We introduce a novel concept to utilize this perfect absorber as plasmonic sensor for refractive index sensing. This sensing strategy offers great potential to maintain the performance of localized surface plasmon sensors even in nonlaboratory environments due to its simple and robust measurement scheme.

Infrared Perfect Absorber and Its Application As Plasmonic Sensor

Surface Electromagnetic Wave Spectroscopy

Generalized Principal Angle of Incidence and Critical Angle

: Optical constants were measured for seven minerals form 20-400 cm (to the minus 1 power). These data were combined with those of Dr. Querry from the University of Missouri-Kansas City to cover the 20-4000 cm (to the minus 1 power) range. Such optical constants are needed to calculate the transmission in the millimeter and submillimeter of soil aerosols in the atmosphere and to assess the value of soil aerosols as obscurants. These optical constants were obtained by Kramers-Kronig analysis of reflectance spectra of pressed powder pellets. The optical constants of iron, aluminum and graphite were obtained from reflectance spectra measured in our laboratory and that of Dr. Querry to cover the region from 20 cm (to the minus 1 power to 20,000 cm (to the minus 1 power.) Literature values were tabulated for 10 additional metals. These optical constants are needed for evaluation of metallic chaffs and powders as obscurants. Other techniques for measuring optical constants of metals in the millimeter and submillimeter were evaluated.

Robert J. Bell

Papers

Surface Electromagnetic Wave Spectroscopy

Generalized Principal Angle of Incidence and Critical Angle

The Optical Constants of Smoke Materials (Naturally Occurring Minerals) Plus Iron and Graphite in the Millimeter and Submillimeter

CHAPTER THREE – Fourier Analysis and Interferometry

CHAPTER EIGHT – Asymmetric Interferometers and Amplitude Spectroscopy