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Roger B. Marks
Researcher at National Institute of Standards and Technology
Publications - 58
Citations - 4520
Roger B. Marks is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Coplanar waveguide & Transmission line. The author has an hindex of 21, co-authored 58 publications receiving 4299 citations. Previous affiliations of Roger B. Marks include WiLAN.
Papers
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Journal ArticleDOI
A multiline method of network analyzer calibration
TL;DR: The author presents a method for the calibration of network analyzers that uses multiple, redundant transmission line standards to minimize the effects of random errors, and exhibits improvements in both accuracy and bandwidth over conventional methods.
Journal ArticleDOI
IEEE standard 802.16: a technical overview of the WirelessMAN/sup TM/ air interface for broadband wireless access
TL;DR: The technical medium access control and physical layer features of the IEEE standard 802.16, with its WirelessMAN/sup TM/ air interface, sets the stage for widespread and effective deployments worldwide.
Journal ArticleDOI
Characteristic impedance determination using propagation constant measurement
Roger B. Marks,Dylan F. Williams +1 more
TL;DR: In this article, a method by which the characteristic impedance of transmission lines may be easily determined from a measurement of the propagation constant is demonstrated, based on a rigorous analysis using realistic approximations to account for the effects of imperfect conductors.
Journal ArticleDOI
A General Waveguide Circuit Theory.
Roger B. Marks,Dylan F. Williams +1 more
TL;DR: This work generalizes and extends the classical circuit theory of electromagnetic waveguides, and definesrices characterizing a linear circuit, and relationships among them, some newly discovered, are derived.
Proceedings ArticleDOI
Comparison of On-Wafer Calibrations
Abstract: A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration from a benchmark calibration. The technique is applied to several popular on-wafer scattering parameter calibrations, and the deviations between those calibrations and the thru-reflect line calibration are quantified.