As photovoltaic penetration of the power grid increases, accurate predictions of return on investment require accurate prediction of decreased power output over time. Degradation rates must be known in order to predict power delivery. This article reviews degradation rates of flat-plate terrestrial modules and systems reported in published literature from field testing throughout the last 40 years. Nearly 2000 degradation rates, measured on individual modules or entire systems, have been assembled from the literature, showing a median value of 0·5%/year. The review consists of three parts: a brief historical outline, an analytical summary of degradation rates, and a detailed bibliography partitioned by technology. Copyright © 2011 John Wiley & Sons, Ltd.

/pdf/photovoltaic-degradation-rates-an-analytical-review-a86in1nx10.pdf

Photovoltaic Degradation Rates—an Analytical Review

Battery storage is generally considered an effective means for reducing the intermittency of electricity generated by solar photovoltaic (PV) systems. However, currently it remains unclear when and under which conditions battery storage can be profitably operated in residential PV systems without policy support. Based on a review of previous studies that have examined the economics of integrated PV-battery systems, in this paper we devise a simulation model that investigates the economic viability of battery storage for residential PV in Germany under eight different electricity price scenarios from 2013 to 2022. In contrast to previous forward-looking studies, we assume that no premium is paid for solar photovoltaic power and/or self-consumed electricity. Additionally, we run the model with a large number of different PV and storage capacities to determine the economically optimal configuration in terms of system size. We find that already in 2013 investments in storage solutions were economically viable for small PV systems. Given the assumptions of our model, the optimal size of both residential PV systems and battery storage rises significantly in the future. Higher electricity retail prices, lower electricity wholesale prices or limited access to the electricity wholesale market add to the profitability of storage. We conclude that additional policy incentives to foster investments in battery storage for residential PV in Germany will only be necessary in the short run. At the same time, the impending profitability of integrated PV-storage systems is likely to further spur the ongoing trend toward distributed electricity generation with major implications for the electricity sector.

/pdf/the-economic-viability-of-battery-storage-for-residential-27sda918if.pdf

The economic viability of battery storage for residential solar photovoltaic systems - A review and a simulation model

Degradations of silicon photovoltaic modules: A literature review

One key factor of reducing the costs of photovoltaic systems is to increase the reliability and the service life time of the PV modules. Today's statistics show degradation rates of the rated power for crystalline silicon PV modules of 0.8%/year Jordan11. To increase the reliability and the service life of PV modules one has to understand the challenges involved. For this reason, the international Task 13 expert team has summarized the literature as well as their knowledge and personal experiences on actual failures of PV modules. The target audience of this work is PV module designers, PV industry, engineering lines, test equipment developers, testing companies, technological research laboratories, standardisation committees, as well as national and regional planning authorities. In the first part, this document reports on the measurement methods which allow the identification and analysis of PV module failures. Currently, a great number of methods are available to characterise PV module failures outdoors and in labs. As well as using I-V characteristics as a diagnostic tool, we explain image based methods and visual inspection. For each method we explain the basis, indicate current best practice, and explain how to interpret the images. Three thermography methods are explained: thermography under steady state conditions, pulse thermography and lock-in thermography. The most commonly used of these methods is thermography under steady state conditions. Furthermore electroluminescence methods have become an increasingly popular standard lab approach for detecting failures in PV modules. 2A less common but easier to use method is UV fluorescence. This method can be used to detect module failures similar to those detected with thermography and electroluminescence techniques; however, the PV modules must be sited outdoors for at least one and a half years for the method to be effective. For visual documentation of module conditions in the field, we set up a standard which is now accepted and used by all authors documenting such tests. This standard format allows the documentation of visible module failures in standardised way and makes the data accessible for statistical evaluation. Furthermore we introduce a signal transition method for the detection of defective circuits in installed PV modules. All methods are linked to the PV module failures which are able to be found with these methods. In the second part, the most common failures of PV modules are described in detail. In particular these failures are: delamination, back sheet adhesion loss, junction box failure, frame breakage, EVA discolouration, cell cracks, snail tracks, burn marks, potential induced degradation, disconnected cell and string interconnect ribbons, defective bypass diodes; and special failures of thin-film modules, such as micro arcs at glued connectors, shunt hot spots, front glass breakage, and back contact degradation. Where possible, the origin of the failure is explained. A reference to the characterisation method is given to identify the failure. If available, statistics of the failure type in the field and from accelerating aging tests are shown. For each failure, a description of safety issues and the influence on the power loss is given, including typical follow-up failure modes. In the third part, new test methods are proposed for detection of PV module failures in the field. A special focus is made on mechanical tests because many problems have arisen in the last few years from the mechanical loading of modules. These mechanical loads occur during transportation and from snow loads on modules mounted on an incline. Furthermore, testing for UV degradation of PV modules, ammonia corrosion (sometimes found in roofs of stock breeding buildings) and potential induced degradation are described. The latter method caused some controversy within the international standardization committee until the finalization of this report because many alternative suggestions from different countries were proposed. The test methods are explained in detail, linked to failure descriptions and the results are compared to real failure occurrences, where possible. During a past Task 13 project phase, we recognised that the topic â��3.2 Characterising and Classifying Failures of PV Modulesâ�� is an important on-going subject in the field of PV research. The current review of failure mechanisms shows that the origin and the power loss associated with some important PV module failures is not yet clear (e.g. snail tracks and cell cracks). There are also still some questions as to how best to test for some types of failure (e.g. potential induced degradation and cell cracks). Furthermore, despite the fact that a defective bypass diode or cell interconnect ribbon in a PV module may possibly lead to a fire, very little work has been done to detect these defects in an easy and reliable way once installed in a PV system. However, there are research groups currently working on those topics in order to overcome these challenges. Therefore, it is planed to continue our in-depth review of failures of photovoltaic modules in an extension of the TASK 13 project.

Review of Failures of Photovoltaic Modules

Potential-induced degradation (PID) has received considerable attention in recent years due to its detrimental impact on photovoltaic (PV) module performance under field conditions. Both crystalline silicon (c-Si) and thin-film PV modules are susceptible to PID. While extensive studies have already been conducted in this area, the understanding of the PID phenomena is still incomplete and it remains a major problem in the PV industry. Herein, a critical review of the available literature is given to serve as a one-stop source for understanding the current status of PID research. This paper also aims to provide an overview of future research paths to address PID-related issues. This paper consists of three parts. In the first part, the modelling of leakage current paths in the module package is discussed. The PID mechanisms in both c-Si and thin-film PV modules are also comprehensively reviewed. The second part summarizes various test methods to evaluate PV modules for PID. The last part focuses on studies related to PID in the omnipresent p-type c-Si PV modules. The dependence of temperature, humidity and voltage on the progression of PID is examined. Preventive measures against PID at the cell, module and system levels are illustrated. Moreover, PID recovery in standard p-type c-Si PV modules is also studied. Most of the findings from p-type c-Si PV modules are also applicable to other PV module technologies.

https://pubs.rsc.org/en/content/articlepdf/2017/ee/c6ee02271e

Potential-induced degradation in photovoltaic modules: a critical review

Over the past decade, degradation and power loss have been observed in PV modules resulting from the stress exerted by system voltage bias. This is due in part to qualification tests and standards that do not adequately evaluate for the durability of modules to the long-term effects of high voltage bias experienced in fielded arrays. High voltage can lead to module degradation by multiple mechanisms. The extent of the voltage bias degradation is linked to the leakage current or coulombs passed from the silicon active layer through the encapsulant and glass to the grounded module frame, which can be experimentally determined; however, competing processes make the effect non-linear and history-dependent. Appropriate testing methods and stress levels are described that demonstrate module durability to system voltage potential-induced degradation (PID) mechanisms. This information, along with outdoor testing that is in progress, is used to estimate the acceleration factors needed to evaluate the durability of modules to system voltage stress. Na-rich precipitates are observed on the cell surface after stressing the module to induce PID in damp heat with negative bias applied to the active layer.

/pdf/system-voltage-potential-induced-degradation-mechanisms-in-1nydh5llx3.pdf

System voltage potential-induced degradation mechanisms in PV modules and methods for test

As photovoltaic (PV) penetration of the power grid increases, it becomes vital to know how decreased power output may affect cost over time. In order to predict power delivery, the decline or degradation rates must be determined accurately. At the Performance and Energy Rating Testbed (PERT) at the Outdoor Test Facility (OTF) at the National Renewable Energy Laboratory (NREL) more than 40 modules from more than 10 different manufacturers were compared for their long-term outdoor stability. Because it can accommodate a large variety of modules in a limited footprint the PERT system is ideally suited to compare modules side-by-side under the same conditions.

/pdf/outdoor-pv-degradation-comparison-4ppm3tx0ou.pdf

Outdoor PV degradation comparison

Acceleration factors are calculated for crystalline silicon photovoltaic modules under system voltage stress by comparing the module power during degradation outdoors with that in accelerated testing at three temperatures and 85% relative humidity. A lognormal analysis is applied to the accelerated lifetime test data, considering failure at 80% of the initial module power. Activation energy of 0.73 eV for the rate of failure is determined for the chamber testing at constant relative humidity, and the probability of module failure at an arbitrary temperature is predicted. To obtain statistical data for multiple modules over the course of degradation in situ of the test chamber, dark I–V measurements are obtained and transformed using superposition, which is found to be well suited for rapid and quantitative evaluation of potential-induced degradation. It is determined that shunt resistance measurements alone do not represent the extent of power degradation. This is explained with a two-diode model analysis that shows an increasing second diode recombination current and ideality factor as the degradation in module power progresses. Failure modes of the modules stressed outdoors are examined and compared with those stressed in accelerated tests.

/pdf/testing-and-analysis-for-lifetime-prediction-of-crystalline-10ihdmqe38.pdf

Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress

IEC 62804 Ed. 1, System voltage durability qualification test for crystalline silicon modules, is being developed. First, two module designs are compared in chamber and in the natural environment of Florida (USA). From these results, a stress level of 60 °C, 85% relative humidity, a bias of nameplate system voltage, 96 h dwell, and a pass/fail limit of 5% relative power degradation at 25 °C and 1000W/m irradiance is initially proposed for the draft protocol. This paper next focuses on one of the main controversies within the development of this standard—the use of damp heat in an environmental chamber versus a conductive foil to complete the circuit to ground during the test. Conventional 60-cell multicrystalline silicon modules with (i) a standard aluminum frame, (ii) a modified frame, and (iii) a rear rail design were tested for potential-induced degradation (PID). These three module designs were stressed at the draft protocol conditions stated above and outdoors, applying negative system voltage bias during hours of daylight to simulate array voltage. The damp heat environmental chamber tests run according to the protocol distinguish the relative resistance of five module designs to PID in the field and correctly rankorder the durability in the field to the extent tested (up to 28months). Finally, the degradation rate is determined at 25 °C using a foil to ground the module face on a subset of modules susceptible to PID, and the results with respect to measured field performance of the modules are discussed. Copyright © 2013 John Wiley & Sons, Ltd.

Development of an IEC test for crystalline silicon modules to qualify their resistance to system voltage stress

Photovoltaic (PV) module degradation rate analysis quantifies the loss of PV power output over time and is useful for estimating the impact of degradation on the cost of energy. An understanding of the degradation of all current-voltage (I-V) parameters helps to determine the cause of the degradation and also gives useful information for the design of the system. This study reports on data collected from 12 distinct monoand poly-crystalline modules deployed at the National Renewable Energy Laboratory (NREL) in Golden, Colorado. Most modules investigated showed < 0.5%/year decrease in maximum power due to short-circuit current decline.

Ryan Smith

Papers

System voltage potential-induced degradation mechanisms in PV modules and methods for test

Outdoor PV degradation comparison

Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress

Development of an IEC test for crystalline silicon modules to qualify their resistance to system voltage stress

Outdoor PV Module Degradation of Current-Voltage Parameters