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S. V. Egorov

Researcher at Russian Academy of Sciences

Publications -  57
Citations -  637

S. V. Egorov is an academic researcher from Russian Academy of Sciences. The author has contributed to research in topics: Microwave & Sintering. The author has an hindex of 12, co-authored 43 publications receiving 528 citations.

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Microwave heating of conductive powder materials

TL;DR: In this article, a consistent formulation describing the absorption of microwaves in electrically conductive materials under different microwave heating conditions is developed, and a special case when conductive powder particles are surrounded by insulating oxide layers is investigated in detail using the effective medium approximation.
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Evidence for microwave enhanced mass transport in the annealing of nanoporous alumina membranes

TL;DR: In this paper, a comparative study of pore evolution in nanostructured alumina membranes under annealing in a gyrotron microwave system and in conventional furnace is described.
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Sintering of nanostructural titanium oxide using millimeter-wave radiation

TL;DR: A comparative study of sintering of different nanocrystalline TiO2 powder materials has been made in this article, where two types of powders (produced by gas condensation and wire explosion methods) and two techniques of compacting were used for the fabrication of the green samples.
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Effect of microwave heating on phase transformations in nanostructured alumina

TL;DR: In this paper, the dependence of the effect on microwave intensity has been characterized quantitatively, and this dependence turns out to be non-monotonic, and the phase transformation rate reaches its maximum when moderate-intensity microwaves are used for heating.
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Synthesis and structural characterization of ultrafine terbium oxide powders

TL;DR: Glycine-nitrate self-propagating high temperature synthesis was used to synthesize terbium oxide nanopowders whose phase transformations were investigated by methods of high-temperature differential scanning calorimetry, dilatometry, and X-ray diffraction analysis as mentioned in this paper.