S
Sang Hun Park
Researcher at Samsung
Publications - 4
Citations - 169
Sang Hun Park is an academic researcher from Samsung. The author has contributed to research in topics: Conductive polymer & Luminous efficacy. The author has an hindex of 3, co-authored 4 publications receiving 166 citations.
Papers
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Journal ArticleDOI
Hole-injecting conducting-polymer compositions for highly efficient and stable organic light-emitting diodes
Tae-Woo Lee,Ohyun Kwon,Mu-gyeom Kim,Sang Hun Park,JaeGwan Chung,Sang Yeol Kim,Youngsu Chung,Joonyong Park,Eun-Sil Han,Dal Ho Huh,Jong-Jin Park,Lyong-Sun Pu +11 more
TL;DR: In this article, conducting polymer compositions are used for hole-injection layer in organic light-emitting diodes, including poly(3,4-ethylenedioxythiophene) (PEDOT), polystyrene sulfonic acid (PSS) and a perfluorinated ionomer.
Journal ArticleDOI
Hole-transporting interlayers for improving the device lifetime in the polymer light-emitting diodes
TL;DR: In this article, the effect of thermal treatment of hole-transporting interlayers between a polymeric hole injection layer and an emitting layer (EML) on the luminous efficiency and the lifetime performance in blue polymer light-emitting diodes was investigated.
Journal ArticleDOI
Designing a Stable Cathode with Multiple Layers to Improve the Operational Lifetime of Polymer Light‐Emitting Diodes
Tae-Woo Lee,Tae-Woo Lee,Kim Mu Gyeom,Sang Hun Park,Sang Yeol Kim,Ohyun Kwon,Tae-Yong Noh,Jong-Jin Park,Tae-Lim Choi,Jong Hyeok Park,Byung Doo Chin +10 more
TL;DR: In this paper, the role of the BaF 2 and Ca layers in terms of electron injection, luminous efficiency, and device lifetime was investigated for a three-layer cathode.
Journal ArticleDOI
Failure Mode Investigation for Blue Polymer EL Device
Mu-gyeom Kim,Sang Yeol Kim,Tae-Woo Lee,Sang Hun Park,Ju Cheol Park,Jong-Jin Park,Lyong Sun Pu +6 more
TL;DR: In this article, the failure mode observed in polymer EL blue device was analyzed by non-destructive and destructive ways, and the authors also observed compositional and morphological variation using TEM-EDX, STM, FT-IR, TOF-SIMS and reverse engineering method as a destructive way.