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Sofya I. Blanter

Researcher at Delft University of Technology

Publications -  10
Citations -  4583

Sofya I. Blanter is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Heterojunction & Semiconductor. The author has an hindex of 6, co-authored 10 publications receiving 3658 citations. Previous affiliations of Sofya I. Blanter include University of Basel.

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Isolation and characterization of few-layer black phosphorus

TL;DR: Castellanos-Gomez et al. as mentioned in this paper described the isolation and characterization of few-layer black phosphorus in the 2D Matererials, and showed that the few layer black phosphorus can be easily isolated and characterized.
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Fast and Broadband Photoresponse of Few-Layer Black Phosphorus Field-Effect Transistors

TL;DR: The ambipolar behavior coupled to the fast and broadband photodetection make few-layer black phosphorus a promising 2D material for photodetsection across the visible and near-infrared part of the electromagnetic spectrum.
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Photocurrent generation with two-dimensional van der Waals semiconductors.

TL;DR: The state-of-the-art in photodetectors based on semiconducting 2D materials are reviewed, focusing on the transition metal dichalcogenides, novel van der Waals materials, black phosphorus, and heterostructures.
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Gate Controlled Photocurrent Generation Mechanisms in High-Gain In₂Se₃ Phototransistors.

TL;DR: This work reports on photodetectors incorporating the layered material In2Se3, which allow complete modulation of a high gain, photogating mechanism in the ON state in favor of fast photoconduction in the OFF state, and demonstrates control over the dominant mechanism responsible for photocurrent generation.
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Isolation and characterization of few-layer black phosphorus

TL;DR: In this paper, a modification of the mechanical exfoliation method, which provides higher yield of atomically thin flakes than conventional mechanical ex-foliation, has been developed, and general guidelines to determine the number of layers using optical microscopy, Raman spectroscopy and transmission electron microscopy.