T
Thomas E. Buchheit
Researcher at Sandia National Laboratories
Publications - 77
Citations - 2016
Thomas E. Buchheit is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: LIGA & Plasticity. The author has an hindex of 24, co-authored 73 publications receiving 1847 citations.
Papers
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Journal ArticleDOI
Modulus-density scaling behaviour and framework architecture of nanoporous self-assembled silicas.
Hongyou Fan,Christopher Hartshorn,Thomas E. Buchheit,David R. Tallant,Roger A. Assink,R. L. Simpson,Dave J. Kissel,Daniel J. Lacks,Salvatore Torquato,C. Jeffrey Brinker,C. Jeffrey Brinker +10 more
TL;DR: The nanostructure-specific hierarchy and systematic increase in framework modulus observed, when decreasing the silica framework thickness below 2 nm, provides a new ability to maximize mechanical properties at a given density needed for nanoporous materials integration.
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Grain-scale experimental validation of crystal plasticity finite element simulations of tantalum oligocrystals
Hojun Lim,Jay Carroll,Corbett Chandler. Battaile,Thomas E. Buchheit,Brad L. Boyce,Christopher R. Weinberger +5 more
TL;DR: In this paper, the grain-scale elastoplastic deformation behavior of coarse-grained body centered cubic (BCC) tantalum was simulated using a crystal plasticity finite element method (CP-FEM) and compared to experimental measurements of intragranular strain and rotation fields.
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On the measurement of the plasticity length scale parameter in LIGA nickel foils
TL;DR: In this article, the length scale for polycrystalline LIGA nickel foils produced by electroplating in a sulfamate bath was measured to be ∼5.6 μm for foils between 25 and 175 μm thick.
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Microstructural and mechanical properties investigation of electrodeposited and annealed LIGA nickel structures
TL;DR: In this article, the microstructure and mechanical properties of LIGA-fabricated nickel (LIGA Ni), electrodeposited using Watts bath and sulfamate bath chemistries were investigated.
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Strength Distributions in Polycrystalline Silicon MEMS
TL;DR: In this article, a series of microscale tensile tests was performed on polysilicon MEMS structures fabricated using Sandia National Laboratories' SUMMiT Vtrade process, and the strength distribution was found to be dependent on the length of the tensile structures, as expected by the Weibull size effect.