T
Tolek Tyliszczak
Researcher at Lawrence Berkeley National Laboratory
Publications - 262
Citations - 14740
Tolek Tyliszczak is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Absorption spectroscopy & Scanning transmission X-ray microscopy. The author has an hindex of 56, co-authored 259 publications receiving 13230 citations. Previous affiliations of Tolek Tyliszczak include McMaster University & American Museum of Natural History.
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Journal ArticleDOI
Evaluation of electronic state of Cs-adsorbed clay minerals by NEXAFS analysis using DFT calculations
Chikashi Suzuki,Tsuyoshi Yaita,Shinichi Suzuki,Joseph I. Pacold,Alison B. Altman,Stefan G. Minasian,Tolek Tyliszczak,David K. Shuh,Hiroyuki Yoshida,Masahiko Osaka +9 more
TL;DR: In this article, a combined analytical method of NEXAFS measurement and DFT-calculation was employed for the evaluation of Cs states in clay minerals, including major transitions and tail structures.
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Experimental and theoretical study of S 2p and C 1s generalized oscillator strengths in CS2
Cássia Curan Turci,Alexandre B. Rocha,Mario Barbatti,Carlos E. Bielschowsky,I.G. Eustatiu,Tolek Tyliszczak,G. Cooper,Adam P. Hitchcock +7 more
TL;DR: In this article, the generalized oscillator strength profiles in the momentum transfer range (K) of (2.a.u.−2 ǫ X 1 Σ g + electronic state to several C(1s) and S(2p) inner-shell electronic excited states of CS2 were compared.
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Experimental and theoretical study of S 2p and C 1s spectroscopy in CS2
I.G. Eustatiu,Tolek Tyliszczak,G. Cooper,Adam P. Hitchcock,Cássia Curan Turci,Alexandre B. Rocha,Mario Barbatti,Carlos E. Bielschowsky +7 more
TL;DR: In this paper, the optical oscillator strength (OOS) and GOS profiles were calculated for vertical excitation from the ground X 1 Σ g + electronic state to several C(1s) and S(2p) inner-shell electronic excited states of CS2 molecule, using high level ab initio (HF-CI) calculations.
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Surface studies by core-excitation reflection electron energy loss spectroscopy
TL;DR: Inelastic electron scattering in a reflection geometry is a useful alternative to synchrotron radiation X-ray absorption spectroscopy for inner-shell excitation studies of surfaces as mentioned in this paper.
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Soft X‐ray Microcopy at the ALS
Gregory Denbeaux,Peter Fischer,Gerd Schneider,J. Alexander Liddle,Erik H. Anderson,A. Pearson,Weilun Chao,Carolyn A. Larabell,Mark A. Le Gros,David Attwood,Tony Warwick,Harald Ade,Sirine C. Fakra,Mary K. Gilles,Adam P. Hitchcock,David Kilcoyne,David K. Shuh,Tolek Tyliszczak,Yinmin Wang,M. H. Rafailovich,Tohru Araki,John R. Lawrence,Gary G. Leppard,Daniele Gerion,Natalia Zaitseva +24 more