T
Tolek Tyliszczak
Researcher at Lawrence Berkeley National Laboratory
Publications - 262
Citations - 14740
Tolek Tyliszczak is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Absorption spectroscopy & Scanning transmission X-ray microscopy. The author has an hindex of 56, co-authored 259 publications receiving 13230 citations. Previous affiliations of Tolek Tyliszczak include McMaster University & American Museum of Natural History.
Papers
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Journal ArticleDOI
Ptychographic imaging and micromagnetic modeling of thermal melting of nanoscale magnetic domains in antidot lattices
Joachim Gräfe,Maxim Skripnik,Maxim Skripnik,Georg Dieterle,Felix Haering,Markus Weigand,Iuliia Bykova,Nick Träger,Hermann Stoll,Hermann Stoll,Tolek Tyliszczak,David Vine,Paul J. Ziemann,Ulf Wiedwald,David A. Shapiro,Ulrich Nowak,Gisela Schütz,Eberhard Goering +17 more
TL;DR: In this paper, the combination of micromagnetic modeling and x-ray microscopy is used to simulate the melting of magnetic domains within the antidot lattice and the results demonstrate that ptychographic imaging can also recover magnetic contrast in the presence of a strong topological variation.
Journal Article
Further development of soft X-ray scanning microscopy with anelliptical undulator at the Advanced Light Source
Tony Warwick,Harald Ade,Sirine C. Fakra,Mary K. Gilles,Adam P. Hitchcock,David Kilcoyne,David K. Shuh,Tolek Tyliszczak +7 more
TL;DR: In this article, the authors focus on the capabilities of STXM at a new beam line that employs an elliptical undulator to give control of the polarization of the x-ray beam.
Proceedings ArticleDOI
Study of Interactions Between Microbes and Minerals by Scanning Transmission X‐Ray Microscopy (STXM)
TL;DR: In this article, an approach based on energy-filtered imaging was used to examine microbemineral interactions and the resulting biominerals, as well as biosignatures in simplified laboratory samples.
Journal ArticleDOI
X‐ray absorption of As low‐energy ion implanted into Si(100) grown by molecular‐beam epitaxy
TL;DR: In this article, the As sites in Si(As) epilayers grown by molecular beam epitaxy (MBE) and doped in situ by low-energy As implantation were investigated.
Journal ArticleDOI
Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities
Tolek Tyliszczak,A. L. David Kilcoyne,J. Alexander Liddle,Tony Warwick,Adam P. Hitchcock,Harald Ade,David K. Shuh +6 more
TL;DR: A paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1-5, 2004 as discussed by the authors presents an extended abstract of the paper presented in this conference.