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Ujjal Das

Researcher at National Institute of Technology, Silchar

Publications -  13
Citations -  278

Ujjal Das is an academic researcher from National Institute of Technology, Silchar. The author has contributed to research in topics: Perovskite (structure) & Resistive random-access memory. The author has an hindex of 7, co-authored 13 publications receiving 88 citations.

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Compliance Current-Dependent Dual-Functional Bipolar and Threshold Resistive Switching in All-Inorganic Rubidium Lead-Bromide Perovskite-Based Flexible Device

TL;DR: In this paper, the inorganic halide perovskites are considered as favorable materials for various electronic applications because of their superior functionality and stability, and they are used for various applications.
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Nonvolatile resistive switching and synaptic characteristics of lead-free all-inorganic perovskite-based flexible memristive devices for neuromorphic systems

TL;DR: The environmentally friendly and uniform CsSnCl3 perovskite films are introduced to act as an active layer in the flexible memristors for the development of next-generation flexible electronics.
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Induced Vacancy-Assisted Filamentary Resistive Switching Device Based on RbPbI3-xClx Perovskite for RRAM Application.

TL;DR: The c-AFM measurements reveal that pure RbPbI3 is insulating in nature, whereas Cl doped films demonstrates resistive switching behavior, and the device with 20% chloride substituted film exhibits higher on/off ratio, extended endurance, long retention and high density storage ability.
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Uniform, large-scale growth of WS2 nanodomains via CVD technique for stable non-volatile RRAM application

TL;DR: In this paper, a bipolar resistive switching (RS) behavior was observed in CVD grown tungsten disulfide (WS2) thin film memory device fabricated on Pt/Ti/SiO2/Si substrate with top Al contacts.