Showing papers by "Uwe Weierstall published in 2006"
TL;DR: In this article, the authors demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images, using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object.
Abstract: Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.
570 citations
Journal Article•
TL;DR: X-ray diffraction imaging with high resolution in all three dimensions is demonstrated, as determined by a quantitative analysis of the reconstructed volume images, and the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources are established.
Abstract: Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources. © 2006 Optical Society of America OCIS codes: 340.7460, 110.1650, 110.6880, 100.5070, 100.6890, 070.2590, 180.6900.
47 citations
Journal Article•
TL;DR: In this paper, the authors demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images, using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object.
Abstract: Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources. © 2006 Optical Society of America OCIS codes: 340.7460, 110.1650, 110.6880, 100.5070, 100.6890, 070.2590, 180.6900.
38 citations
4 citations
Patent•
21 Feb 2006TL;DR: In this article, the authors present methods for molecular structure determination using serial diffraction, and devices for carrying out the methods of the invention, which are described in detail in detail.
Abstract: The present invention provides methods for molecular structure determination using serial diffraction, and devices for carrying out the methods of the invention.
4 citations
Patent•
14 Mar 2006TL;DR: In this paper, the authors present methods and devices for rapidly forming vitreous ice-jacketed particle droplets, which are then used for particle particle particle encapsulation.
Abstract: The present invention provides methods and devices for rapidly forming vitreous ice-jacketed particle droplets.
2 citations
TL;DR: Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 - August 3, 2006 as mentioned in this paper, is presented in this paper.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
TL;DR: In this paper, the authors have designed and commissioned an apparatus for serial crystallography of hydrated proteins at the Advanced Light Synchrotron (ALS) at the University of Southern California.
Abstract: We have designed and commissioned an apparatus for serial crystallography of hydrated proteins at the Advanced Light
Source. Serial crystallography is a recently proposed method of imaging uncrystallized proteins at a third generation
synchrotron source. This paper describes the design of the apparatus and results from the first experiment, which
recorded x-ray diffraction patterns from 8 micron droplets containing photosystem 1 protein molecules.